scholarly journals Binocular vision profilometry for large-sized rough optical elements using binarized band-limited pseudo-random patterns

2019 ◽  
Vol 27 (8) ◽  
pp. 10890 ◽  
Author(s):  
Chao Li ◽  
Changhe Zhou ◽  
Chaofeng Miao ◽  
Yu Yan ◽  
Junjie Yu
Keyword(s):  
Binocular Vision ◽  
Optical Elements ◽  
Band Limited ◽  
Random Patterns

Size character optimization for measurement system with binocular vision and optical elements based on local particle swarm method

2015 ◽  
Vol 22 (1) ◽  
pp. 58-64 ◽  
Author(s):  
Guan Xu ◽  
Xue Lu ◽  
Xiaotao Li ◽  
Jian Su ◽  
Guangdong Tian ◽  
...  
Keyword(s):  
Binocular Vision ◽  
Measurement System ◽  
Particle Swarm ◽  
Optical Elements ◽  
Particle Swarm Method

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Characterization of Rh/Si multilayer structure by HREM and HAADF

1992 ◽  
Vol 50 (1) ◽  
pp. 122-123
Author(s):  
Y. Cheng ◽  
J. Liu ◽  
M.B. Stearns ◽  
D.G. Steams
Keyword(s):  
Normal Incidence ◽  
High Resolution Electron Microscopy ◽  
X Rays ◽  
Beam Direction ◽  
Cross Sectional ◽  
Optical Elements ◽  
Resolution Electron ◽  
Point To Point ◽  
Better Than

The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date for ML fabricated by dc magnetron sputtering. In order to determine the cause of this degraded reflectivity the microstructure of this ML was examined on cross-sectional specimens with two high-resolution electron microscopy (HREM and HAADF) techniques.Cross-sectional specimens were made from an as-prepared ML sample and from the same ML annealed at 298 °C for 1 and 100 hours. The specimens were imaged using a JEM-4000EX TEM operating at 400 kV with a point-to-point resolution of better than 0.17 nm. The specimens were viewed along Si [110] projection of the substrate, with the (001) Si surface plane parallel to the beam direction.

Anticipatory memory for regular and random patterns.

2020 ◽  
Vol 46 (9) ◽  
pp. 965-978 ◽  
Author(s):  
Irem Yildirim ◽  
Helene Intraub
Keyword(s):  
Random Patterns

Curiosities of Binocular Vision

1913 ◽  
Vol 76 (1964supp) ◽  
pp. 122-123
Author(s):  
Frederic Campbell
Keyword(s):  
Binocular Vision

Method of estimation of hidden correlation of narrowband noise signals

2019 ◽  
pp. 34-39 ◽  
Author(s):  
E.I. Chernov ◽  
N.E. Sobolev ◽  
A.A. Bondarchuk ◽  
L.E. Aristarhova
Keyword(s):  
Signal Processing ◽  
Digital Signal Processing ◽  
New Technology ◽  
Digital Signal ◽  
Measuring Instruments ◽  
Central Frequency ◽  
Pearson Criterion ◽  
Useful Signal ◽  
Band Limited ◽  
Narrowband Noise

The concept of hidden correlation of noise signals is introduced. The existence of a hidden correlation between narrowband noise signals isolated simultaneously from broadband band-limited noise is theoretically proved. A method for estimating the latent correlation of narrowband noise signals has been developed and experimentally investigated. As a result of the experiment, where a time frag ent of band-limited noise, the basis of which is shot noise, is used as the studied signal, it is established: when applying the Pearson criterion, there is practically no correlation between the signal at the Central frequency and the sum of signals at mirror frequencies; when applying the proposed method for the analysis of the same signals, a strong hidden correlation is found. The proposed method is useful for researchers, engineers and metrologists engaged in digital signal processing, as well as developers of measuring instruments using a new technology for isolating a useful signal from noise – the method of mirror noise images.

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