scholarly journals Breakthrough spectrophotometric instrument for the ultra-fine characterization of the spectral transmittance of thin-film optical filters

2018 ◽  
Vol 26 (26) ◽  
pp. 34236 ◽  
Author(s):  
Michel Lequime ◽  
Myriam Zerrad ◽  
Claude Amra
1992 ◽  
Vol 293 ◽  
Author(s):  
S. J. Golden ◽  
B.C.H. Steele

AbstractThin films of tin-doped indium oxide (I.T.O.) were produced by r.f. sputtering and lithiated electrochemically in LiClO4-PC. X-ray diffraction studies showed a cubic structure with a small increase in the cubic lattice parameter with x up to unity (LixITO). Electrochemical studies indicated that Li insertion is reversible, at least over a small number of cycles. Spectral transmittance decreased slightly with considerable levels of insertion indicating low electrochromic colouration efficiencies and making thin film I.T.O. a suitable counter-electrode material for electrochromic window systems.


Author(s):  
E. L. Hall ◽  
A. Mogro-Campero ◽  
L. G. Turner ◽  
N. Lewis

There is great interest in the growth of thin superconducting films of YBa2Cu3Ox on silicon, since this is a necessary first step in the use of this superconductor in a variety of possible electronic applications including interconnects and hybrid semiconductor/superconductor devices. However, initial experiments in this area showed that drastic interdiffusion of Si into the superconductor occurred during annealing if the Y-Ba-Cu-O was deposited direcdy on Si or SiO2, and this interdiffusion destroyed the superconducting properties. This paper describes the results of the use of a zirconia buffer layer as a diffusion barrier in the growth of thin YBa2Cu3Ox films on Si. A more complete description of the growth and characterization of these films will be published elsewhere.Thin film deposition was carried out by sequential electron beam evaporation in vacuum onto clean or oxidized single crystal Si wafers. The first layer evaporated was 0.4 μm of zirconia.


Author(s):  
Gyeung Ho Kim ◽  
Mehmet Sarikaya ◽  
D. L. Milius ◽  
I. A. Aksay

Cermets are designed to optimize the mechanical properties of ceramics (hard and strong component) and metals (ductile and tough component) into one system. However, the processing of such systems is a problem in obtaining fully dense composite without deleterious reaction products. In the lightweight (2.65 g/cc) B4C-Al cermet, many of the processing problems have been circumvented. It is now possible to process fully dense B4C-Al cermet with tailored microstructures and achieve unique combination of mechanical properties (fracture strength of over 600 MPa and fracture toughness of 12 MPa-m1/2). In this paper, microstructure and fractography of B4C-Al cermets, tested under dynamic and static loading conditions, are described.The cermet is prepared by infiltration of Al at 1150°C into partially sintered B4C compact under vacuum to full density. Fracture surface replicas were prepared by using cellulose acetate and thin-film carbon deposition. Samples were observed with a Philips 3000 at 100 kV.


Author(s):  
Alfred Ludwig ◽  
Mona Nowak ◽  
Swati Kumari ◽  
Helge S. Stein ◽  
Ramona Gutkowski ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document