scholarly journals Oblique incidence of semi-guided planar waves on slab waveguide steps: effects of rounded edges

2018 ◽  
Vol 26 (14) ◽  
pp. 18621 ◽  
Author(s):  
Lena Ebers ◽  
Manfred Hammer ◽  
Jens Förstner
Keyword(s):  
Oblique Incidence ◽  
Slab Waveguide

scholarly journals Differentiation of Optical Signals with Dielectric Ridges on Top of a Slab Waveguide

Vestnik RFFI ◽  
2019 ◽  
pp. 35-45
Author(s):  
Victor A. Soifer ◽  
Nikita V. Golovastikov ◽  
Leonid L. Doskolovich ◽  
Evgeni A. Bezus ◽  
Dmitry A. Bykov
Keyword(s):  
Numerical Simulation ◽  
Oblique Incidence ◽  
Spatial Differentiation ◽  
Slab Waveguide ◽  
High Quality ◽  
Optical Signals ◽  
Quality Differentiation ◽  
Analog Computing ◽  
Planar Structures ◽  
Simulation Results

We propose two simple planar structures that enable spatial differentiation of the profile of optical beams propagating in a slab waveguide. The differentiator operating in transmission consists of a single subwavelength dielectric ridge on the surface of a slab waveguide. The differentiator operating in reflection consists of two grooves on the surface of a slab waveguide. In both cases the differentiation is performed at oblique incidence of the beam and is associated with the resonant excitation of the considered structures eigenmodes localized at the ridge or at the ridge between two grooves. It is shown that the required balance between the differentiation quality and the amplitude of the differentiated beam can be achieved by manipulating the quality factor of the resonance. The presented numerical simulation results demonstrate high-quality differentiation. The proposed differentiator may find application in ultrafast analog computing and signal processing systems.

Study of the Leakage Loss in a Silica-on-Silicon Slab Waveguide

2003 ◽  
Vol 22 (4) ◽  
pp. 249-261 ◽  
Author(s):  
JUN LU ◽  
SAILING HE ◽  
VLADIMIR ROMANOV
Keyword(s):  
Slab Waveguide ◽  
Leakage Loss ◽  
Silicon Slab

Scattering Rings in Birefringent Porous Silicon

2003 ◽  
Vol 762 ◽  
Author(s):  
Claudio J. Oton ◽  
Zeno Gaburro ◽  
Mher Ghulinyan ◽  
Nicola Daldosso ◽  
Lucio Pancheri ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Light Scattering ◽  
Porous Silicon ◽  
Direct Measurement ◽  
Optical Anisotropy ◽  
Oblique Incidence ◽  
Laser Light ◽  
Anisotropic Scattering ◽  
Scattering Measurements

AbstractWe report the observation of strongly anisotropic scattering of laser light at oblique incidence on (100)-oriented porous silicon layers. We performed angle-resolved light scattering measurements and three concentric rings were observed. Modeling porous silicon by means of nanometric columnar air pores and an effective anisotropic uniaxial dielectric constant explains the observed phenomenon, and besides, the observation of the angle aperture of these rings allows a direct measurement of relative birefringence. We finally study the changes of optical anisotropy after different modifications of the structure.

Pb Electrodeposition in the Presence of Chlorine Ions on Cu(100): An in Situ Optical Reflectivity Difference Study

2003 ◽  
Vol 781 ◽  
Author(s):  
J. Gray ◽  
W. Schwarzacher ◽  
X.D. Zhu
Keyword(s):  
Oblique Incidence ◽  
Opposite Sign ◽  
Bulk Phase ◽  
Phase Layer ◽  
Optical Reflectivity ◽  
Scan Rate ◽  
Different Types ◽  
Chlorine Ions ◽  
High Overpotentials

AbstractWe studied the initial stages of the electrodeposition of Pb in the presence of chlorine ions on Cu(100), using an oblique-incidence optical reflectivity difference (OIRD) technique. The OI-RD results reveal that immediately following the underpotential deposition (UPD) of the first Pb monolayer, two different types of bulk-phase films grow depending upon the magnitude of overpotential and cyclic voltammetry (CV) scan rate. At low overpotentials and/or slow scan rates, we propose that a bulk-phase Pb film grows on top of the UPD monolayer. At high overpotentials and/or fast scan rates, either a PbO, PbCl2, or a rough Pb bulk-phase layer grows on top of the UPD layer such that the reflectivity difference signal from such a film has an opposite sign.

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