scholarly journals Determination of optical properties of turbid medium from relative interstitial CW radiance measurements using the incomplete P3 approximation

2017 ◽  
Vol 25 (21) ◽  
pp. 25295 ◽  
Author(s):  
Lingling Liu ◽  
Wenbo Wan ◽  
Zhuanping Qin ◽  
Limin Zhang ◽  
Jingying Jiang ◽  
...  
Keyword(s):  
Optical Properties ◽  
Turbid Medium

Effects of the surface boundary on the determination of the optical properties of a turbid medium with time-resolved reflectance

2006 ◽  
Vol 45 (19) ◽  
pp. 4756 ◽  
Author(s):  
Aurélie Laidevant ◽  
Anabela da Silva ◽  
Michel Berger ◽  
Jean-Marc Dinten
Keyword(s):  
Optical Properties ◽  
Turbid Medium ◽  
Surface Boundary ◽  
Time Resolved

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

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