Measurement of charge carrier mobilities in thin films on metal substrates by reflection time resolved terahertz spectroscopy
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2011 ◽
Vol 13
(7)
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pp. 2850-2856
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2012 ◽
Vol 116
(37)
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pp. 19665-19672
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2006 ◽
Vol 110
(50)
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pp. 25229-25239
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2016 ◽
Vol 120
(28)
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pp. 15395-15406
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2017 ◽
Vol 19
(8)
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pp. 6006-6012
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