scholarly journals Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers

2017 ◽  
Vol 25 (9) ◽  
pp. 9647 ◽  
Author(s):  
Mohesh Moothanchery ◽  
Viswanath Bavigadda ◽  
Manojit Pramanik ◽  
Vincent Toal ◽  
Izabela Naydenova
Keyword(s):  
Speckle Pattern ◽  
Phase Shifting ◽  
Electronic Speckle Pattern Interferometry

Phase Algorithm Integrating Direct-Correlation and Four-Step Phase-Shifting for Electronic Speckle Pattern Interferometry

2013 ◽  
Vol 448-453 ◽  
pp. 3696-3701
Author(s):  
Yan Bin He ◽  
Xin Zhong Li ◽  
Min Zhou
Keyword(s):  
High Speed ◽  
Speckle Pattern ◽  
Phase Shifting ◽  
Electronic Speckle Pattern Interferometry ◽  
High Speed Camera ◽  
Dynamic Measurements ◽  
High Quality ◽  
Correlation Algorithm ◽  
Phase Map

A phase-shifting algorithm, called a (4,4) algorithm, which takes four phase-shifting interferograms before a specimen is deformed and four interferograms after a specimen is deformed, is presented first. This method is most widely used for phase extraction. Its drawback limited it to be used in dynamic measurements. Also shown is an algorithm called a (4,1) algorithm that takes four phase-shifting interferograms before a specimen is deformed and one interferogram after a specimen is deformed. Because a high-speed camera can be used to record the dynamic interferogram of the specimen, this algorithm has the potential to retain the phase-shifting capability for ESPI in dynamic measurements. The quality of the phase map obtained using (4,1) algorithm is quite lower compared to using (4,4) algorithm. In order to obtain high-quality phase map in dynamic measurements, a direct-correlation algorithm was integrated with the (4,1) algorithm to form DC-(4,1) algorithm which is shown to improve significantly the quality of the phase maps. The theoretical and experimental aspects of this newly developed technique, which can extend ESPI to areas such as high-speed dynamic measurements, are examined in detail.

Use of specklegrams background terms for speckle photography combined with phase-shifting electronic speckle pattern interferometry

2015 ◽  
Vol 54 (8) ◽  
pp. 084110 ◽  
Author(s):  
Redouane Zemmamouche ◽  
Jean-François Vandenrijt ◽  
Aïcha Medjahed ◽  
Ivan de Oliveira ◽  
Marc P. Georges
Keyword(s):  
Speckle Pattern ◽  
Phase Shifting ◽  
Electronic Speckle Pattern Interferometry ◽  
Speckle Photography

scholarly journals Phase-shifting algorithms for electronic speckle pattern interferometry

2002 ◽  
Vol 41 (1) ◽  
pp. 46 ◽  
Author(s):  
Chih-Cheng Kao ◽  
Gym-Bin Yeh ◽  
Shu-Sheng Lee ◽  
Chih-Kung Lee ◽  
Ching-Sang Yang ◽  
...  
Keyword(s):  
Speckle Pattern ◽  
Phase Shifting ◽  
Electronic Speckle Pattern Interferometry

Matched spatial-phase-shifting for the temporal-phase-unwrapping in electronic speckle pattern interferometry

Optik ◽  
2001 ◽  
Vol 112 (11) ◽  
pp. 515-520 ◽  
Author(s):  
R.A. Martínez-Celorio ◽  
A. Dávila ◽  
B. Barrientos ◽  
J.H. Puga ◽  
Luis Martí López
Keyword(s):  
Speckle Pattern ◽  
Phase Unwrapping ◽  
Phase Shifting ◽  
Electronic Speckle Pattern Interferometry ◽  
Spatial Phase ◽  
Temporal Phase

scholarly journals Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization

2021 ◽  
pp. 127245
Author(s):  
Gustavo A. Gómez-Méndez ◽  
Amalia Martínez-García ◽  
David I. Serrano-García ◽  
Juan Antonio Rayas-Álvarez ◽  
Areli Montes Pérez ◽  
...  
Keyword(s):  
Speckle Pattern ◽  
Phase Shifting ◽  
Electronic Speckle Pattern Interferometry ◽  
Plane Deformations
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