scholarly journals Star test image-sampling polarimeter

2016 ◽  
Vol 24 (20) ◽  
pp. 23154 ◽  
Author(s):  
Brandon G. Zimmerman ◽  
Thomas G. Brown
Keyword(s):  
Test Image ◽  
Image Sampling ◽  
Star Test

A New Method for Railway Fastener Detection Using the Symmetrical Image and Its EA-HOG Feature

2019 ◽  
Vol 34 (02) ◽  
pp. 2055006
Author(s):  
Jiajia Liu ◽  
Jianying Yuan ◽  
Yongfang Jia
Keyword(s):  
Computer Vision ◽  
Sparse Representation ◽  
Efficient Method ◽  
Important Task ◽  
New Method ◽  
Automatic Inspection ◽  
Test Image ◽  
Recognition Result ◽  
The Status ◽  
Railway Operation

Railway fastener recognition and detection is an important task for railway operation safety. However, the current automatic inspection methods based on computer vision can effectively detect the intact or completely missing fasteners, but they have weaker ability to recognize the partially worn ones. In our method, we exploit the EA-HOG feature fastener image, generate two symmetrical images of original test image and turn the detection of the original test image into the detection of two symmetrical images, then integrate the two recognition results of symmetrical image to reach exact recognition of original test image. The potential advantages of the proposed method are as follows: First, we propose a simple yet efficient method to extract the fastener edge, as well as the EA-HOG feature of the fastener image. Second, the symmetry images indeed reflect some possible appearance of the fastener image which are not shown in the original images, these changes are helpful for us to judge the status of the symmetry samples based on the improved sparse representation algorithm and then obtain an exact judgment of the original test image by combining the two corresponding judgments of its symmetry images. The experiment results show that the proposed approach achieves a rather high recognition result and meets the demand of railway fastener detection.

Improving Local Features by Dithering-Based Image Sampling

2015 ◽  
pp. 601-613 ◽  
Author(s):  
Christos Varytimidis ◽  
Konstantinos Rapantzikos ◽  
Yannis Avrithis ◽  
Stefanos Kollias
Keyword(s):  
Local Features ◽  
Image Sampling

Lighting Equilibrium Distribution Maps and Their Application to Face Recognition Under Difficult Lighting Conditions

2017 ◽  
Vol 31 (03) ◽  
pp. 1756003 ◽  
Author(s):  
Jun Dong ◽  
Xue Yuan ◽  
Fanlun Xiong
Keyword(s):  
Face Recognition ◽  
Equilibrium Distribution ◽  
Main Idea ◽  
Data Sets ◽  
Test Image ◽  
Distribution Maps ◽  
Lighting Conditions ◽  
Map Construction ◽  
Compensation Methods ◽  
Approximation Coefficients

In this paper, a novel facial-patch based recognition framework is proposed to deal with the problem of face recognition (FR) on the serious illumination condition. First, a novel lighting equilibrium distribution maps (LEDM) for illumination normalization is proposed. In LEDM, an image is analyzed in logarithm domain with wavelet transform, and the approximation coefficients of the image are mapped according to a reference-illumination map in order to normalize the distribution of illumination energy due to different lighting effects. Meanwhile, the detail coefficients are enhanced to achieve detail information emphasis. The LEDM is obtained by blurring the distances between the test image and the reference illumination map in the logarithm domain, which may express the entire distribution of illumination variations. Then, a facial-patch based framework and a credit degree based facial patches synthesizing algorithm are proposed. Each normalized face images is divided into several stacked patches. And, all patches are individually classified, then each patch from the test image casts a vote toward the parent image classification. A novel credit degree map is established based on the LEDM, which is deciding a credit degree for each facial patch. The main idea of credit degree map construction is the over-and under-illuminated regions should be assigned lower credit degree than well-illuminated regions. Finally, results are obtained by the credit degree based facial patches synthesizing. The proposed method provides state-of-the-art performance on three data sets that are widely used for testing FR under different illumination conditions: Extended Yale-B, CAS-PEAL-R1, and CMUPIE. Experimental results show that our FR frame outperforms several existing illumination compensation methods.

scholarly journals Model Identifikasi Pemalsuan Ijazah menggunakan Gabor Wavelet dan Gaussian Mixture Models Super Vektor (GMM-SV)

2020 ◽  
Vol 4 (2) ◽  
pp. 87
Author(s):  
Alfina Alfina ◽  
Dzulgunar Muhammad Nasir
Keyword(s):  
Mixture Models ◽  
Gaussian Mixture Models ◽  
Gaussian Mixture ◽  
Gabor Wavelet ◽  
Educational Institutions ◽  
Test Image ◽  
Accuracy Rate ◽  
Tertiary Institutions ◽  
Speed Up ◽  
Basic Image

Various cases occur related to certificate falsification and some people and educational institutions have to deal with the law, this problem is not impossible to abuse along with advances and technological innovation with various tools that can be used by anyone. Identifying the diploma document must be of particular concern to tertiary institutions to minimize the associated fake diplomas and the diploma legalization process. In legalizing the diploma for STMIK Indonesia Banda Aceh students, checking the authenticity of the certificate is only by bringing the original certificate and photocopy of the certificate or by contacting the academic party who issued the certificate, this process is sometimes missed by officers when the queue is crowded. The specific objectives of the research include implementing a model and feature method of Gabor Wavelet and Gaussian Mixture Models Super Vector (GMM-SV) for document identification to speed up diploma identification. The flow of this research starts from the input in the form of a basic image as an image that a reference for the authenticity of the diploma. Then the test image input is an image that will be tested for authenticity. The results showed that using the Gabor Wavelet feature and the Gaussian Mixture Models Super Vector (GMM-SV) could identify fake diplomas with an accuracy rate of 92.8%.Keywords:Model, Identification, Certificate Falsification, Gabor Wavelet, Gaussian Mixture Models Super Vector (GMM-SV).

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