scholarly journals Aluminum nitride electro-optic phase shifter for backend integration on silicon

2016 ◽  
Vol 24 (12) ◽  
pp. 12501 ◽  
Author(s):  
Shiyang Zhu ◽  
Guo-Qiang Lo
Keyword(s):  
Aluminum Nitride ◽  
Phase Shifter ◽  
Electro Optic

Design of an Electro-Optic Modulator Based on a Silicon-Plasmonic Hybrid Phase Shifter

2013 ◽  
Vol 31 (8) ◽  
pp. 1170-1177 ◽  
Author(s):  
Mu Xu ◽  
Fei Li ◽  
Tao Wang ◽  
Jiayang Wu ◽  
Liyang Lu ◽  
...  
Keyword(s):  
Phase Shifter ◽  
Electro Optic ◽  
Electro Optic Modulator

scholarly journals Low-Loss, Silicon Integrated, Aluminum Nitride Photonic Circuits and Their Use for Electro-Optic Signal Processing

Nano Letters ◽  
2012 ◽  
Vol 12 (7) ◽  
pp. 3562-3568 ◽  
Author(s):  
Chi Xiong ◽  
Wolfram H. P. Pernice ◽  
Hong X. Tang
Keyword(s):  
Signal Processing ◽  
Aluminum Nitride ◽  
Low Loss ◽  
Photonic Circuits ◽  
Electro Optic

Design of Mid-infrared electro-optic modulators based on aluminum nitride waveguides

2016 ◽  
pp. 1-1 ◽  
Author(s):  
Shuai Liu ◽  
Ke Xu ◽  
Qinghai Song ◽  
Zhenzhou Cheng ◽  
Hon Tsang
Keyword(s):  
Aluminum Nitride ◽  
Mid Infrared ◽  
Electro Optic

Hybrid silicon organic high speed electro-optic phase shifter

2013 ◽  
Author(s):  
Soon Thor Lim ◽  
Maoqing Xin ◽  
Ching Eng Png ◽  
Vivek Dixit ◽  
Aaron J. Danner
Keyword(s):  
High Speed ◽  
Phase Shifter ◽  
Electro Optic ◽  
Hybrid Silicon

A PRACTICAL ELECTRO-OPTIC SAMPLER FOR CHARACTERIZATION INTERNAL TO GaAs ICs

1996 ◽  
Vol 07 (03) ◽  
pp. 463-469 ◽  
Author(s):  
MAOBIN YI ◽  
WEI SUN ◽  
XIAOJIAN TIAN ◽  
GANG JIA ◽  
SHIYONG LIU
Keyword(s):  
Integrated Circuit ◽  
Interference Effect ◽  
Phase Shifter ◽  
Electrical Signal ◽  
Sampling Point ◽  
Linear Sweep ◽  
Noninvasive Measurements ◽  
Electro Optic ◽  
Dynamic Frequency ◽  
Signal Field

This paper describes a practical electro-optic sampler of the measuring-microscope mode for noninvasive measurements of voltage waveforms at points internal to a GaAs integrated circuit. A 360° linear sweep phase shifter is used to provide the scanning delay of the sampling point in time, and was typically demonstrated in measuring the dynamic frequency divider circuit. In addition to the characterization internal to GaAs ICs, the overlap of the electrical signal field in an integrated circuit and the interference effect on the signal voltage calibration are also investigated.

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