scholarly journals Direct high-precision measurement of the effective optical path length of multi-pass cell with optical frequency domain reflectometer

2016 ◽  
Vol 24 (1) ◽  
pp. 417 ◽  
Author(s):  
Z. H. Du ◽  
H. Gao ◽  
X. H. Cao
Keyword(s):  
Frequency Domain ◽  
High Precision ◽  
Precision Measurement ◽  
Path Length ◽  
Optical Path Length ◽  
Optical Path ◽  
Optical Frequency ◽  
High Precision Measurement ◽  
Effective Optical Path Length

Effective optical path length investigation for cubic diffuse cavity as gas absorption cell

2013 ◽  
Vol 116 (1) ◽  
pp. 135-140 ◽  
Author(s):  
Jia Yu ◽  
Fu Zheng ◽  
Qiang Gao ◽  
Yinjie Li ◽  
Yungang Zhang ◽  
...  
Keyword(s):  
Path Length ◽  
Optical Path Length ◽  
Optical Path ◽  
Gas Absorption ◽  
Absorption Cell ◽  
Effective Optical Path Length

Integrating sphere effective optical path length calibration by gas absorption spectroscopy

2013 ◽  
Vol 114 (3) ◽  
pp. 341-346 ◽  
Author(s):  
Qiang Gao ◽  
Yungang Zhang ◽  
Jia Yu ◽  
Zhiguo Zhang ◽  
Shaohua Wu ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Path Length ◽  
Optical Path Length ◽  
Optical Path ◽  
Gas Absorption ◽  
Integrating Sphere ◽  
Effective Optical Path Length

scholarly journals Optical Control System for Displacement Monitoring of the High Precision Measurement Setup Elements

2019 ◽  
Vol 22 (4) ◽  
pp. 89-98
Author(s):  
Victor V. Kholkin ◽  
Vladimir Yu. Kholkin
Keyword(s):  
Signal Processing ◽  
Control System ◽  
High Precision ◽  
Precision Measurement ◽  
Background Radiation ◽  
Digital Signal ◽  
Optical Path ◽  
Optical Control ◽  
Displacement Monitoring ◽  
High Precision Measurement

Introduction. It is necessary to ensure the reliability of measurements when operating high-precision measurement setups. The elements displacement of the measurement path introduces measurement results distortions, especially in measurement setups operating in the microwave range. It is necessary to monitor the elements positions of the measurement setup to ensure the measurements reliability. The monitoring should be performed during the measurement, and the control device should be connected to the automatic control system of the measurement setup, and it should neither mechanically affect the setup elements nor introduce the electrical and electromagnetic interferences.Objective. The objective of the present work is a design of the control system, which allows monitoring of elements displacements of the high precision measuring setup with an accuracy of 1.0·10–4 mm. And the designed control system should neither mechanically affect the controlled elements nor introduce the electrical and electromagnetic interferences, thus allowing the digital signal processing.Materials and methods. The designed system utilizes optical methods of the displacements monitoring, which are based on the geometric optics principles. The charge-coupled devices (CCD) to record the system response to optical path changes are used.Results. Two designs of the control system for the displacement monitoring of the high precision measurement setup elements are presented. The first system design allows detecting the elements displacement occurrence, and the second system design allows to identify the displaced element. The system is capable to register the elements displacements with accuracy of 1.0·10–4 mm and monitor the elements positions while vibration exposures. The system does not mechanically or electromagnetically affect the controlled elements. All system elements are resistant to the microwave radiation and increased background radiation, excluding CCD that should be placed outside the active zone. The mathematical simulation allows assessing the sensitivity of the designed optical control system. The system sensitivity increasing method by the optical path increasing and corrective reflector using is proposed.Conclusion. The designed control system for the displacements monitoring of the high precision measurement setup elements meets the requirements imposed on it. The system allows the digital signal processing and can withstand the increased microwave, X-ray and background radiation. The designed system is much simpler to implement in comparison with systems based on other physical principles. The novelty of the control system technical solution is confirmed by the patent. 

High precision measurement of the SOS surface thickness in the rough phase

1991 ◽  
Vol 1 (12) ◽  
pp. 1669-1673 ◽  
Author(s):  
Hans Gerd Evertz ◽  
Martin Hasenbusch ◽  
Mihail Marcu ◽  
Klaus Pinn ◽  
Sorin Solomon
Keyword(s):  
High Precision ◽  
Precision Measurement ◽  
High Precision Measurement ◽  
Surface Thickness
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