scholarly journals High-precision flow temperature imaging using ZnO thermographic phosphor tracer particles

2015 ◽  
Vol 23 (15) ◽  
pp. 19453 ◽  
Author(s):  
Christopher Abram ◽  
Benoit Fond ◽  
Frank Beyrau
2012 ◽  
Vol 20 (20) ◽  
pp. 22118 ◽  
Author(s):  
Benoit Fond ◽  
Christopher Abram ◽  
Andrew L Heyes ◽  
Andreas M Kempf ◽  
Frank Beyrau

Author(s):  
Moritz Stelter ◽  
Fabio J. W. A. Martins ◽  
Frank Beyrau ◽  
Benoît Fond

Many flows of technical and scientific interest are intrinsically three-dimensional. Extracting slices using planar measurement techniques allows only a limited view into the flow physics and can introduce ambiguities while investigating the extent of 3D regions. Nowadays, thanks to tremendous progress in the field of volumetric velocimetry, full 3D-3C velocity information can be gathered using tomographic PIV or PTV hence eliminating many of these ambiguities (Discetti and Coletti, 2018; Westerweel et al., 2013). However, for scalar quantities like temperature, 3D measurements remain challenging. Previous approaches for coupled 3D thermometry and velocimetry combined astigmatism PTV with encapsulated europium chelates particles (Massing et al., 2018) or tomographic PIV with thermochromic liquid crystals particles (Schiepel et al., 2021). Here we present a new technique based on solid thermographic phosphor tracer particles, which have been extensively used for planar fluid temperature and velocity measurements (Abram et al., 2018) and are applicable in a wide range of temperatures. The particles are seeded into a gas flow where their 3D positions are retrieved by triangulation from multiple views and their temperatures are derived from two-colour luminescence ratio imaging. In the following, the experimental setup and key processing steps are described before a demonstration of the concept in a turbulent heated jet is shown.


Author(s):  
Christopher Abram ◽  
Miriam Pougin ◽  
Benoit Fond ◽  
Frank Beyrau

2020 ◽  
Vol 45 (14) ◽  
pp. 3893
Author(s):  
Christopher Abram ◽  
Irin Wilson Panjikkaran ◽  
Simon Nnalue Ogugua ◽  
Benoit Fond

Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.


Author(s):  
K. Z. Botros ◽  
S. S. Sheinin

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.


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