scholarly journals High precision optical cavity length and width measurements using double modulation

2015 ◽  
Vol 23 (15) ◽  
pp. 19417 ◽  
Author(s):  
A. Staley ◽  
D. Hoak ◽  
A. Effler ◽  
K. Izumi ◽  
S. Dwyer ◽  
...  
Keyword(s):  
High Precision ◽  
Cavity Length ◽  
Optical Cavity ◽  
Width Measurements ◽  
Double Modulation

Study on the sensitivity of optical cavity length to light power fluctuation

2016 ◽  
Vol 14 (10) ◽  
pp. 101401-101405
Author(s):  
Wen Qi Wen Qi ◽  
Yanyi Jiang Yanyi Jiang ◽  
Xueyan Li Xueyan Li ◽  
Li Jin Li Jin ◽  
Zhiyi Bi Zhiyi Bi ◽  
...  
Keyword(s):  
Cavity Length ◽  
Optical Cavity ◽  
Power Fluctuation ◽  
Light Power

Effect of optical-cavity length on laser photon statistics

1978 ◽  
Vol 18 (2) ◽  
pp. 644-654 ◽  
Author(s):  
C. -Y. Huang ◽  
L. Mandel
Keyword(s):  
Cavity Length ◽  
Optical Cavity ◽  
Photon Statistics ◽  
Laser Photon

A novel approach for pulse width measurements with a high precision (8 ps RMS) TDC in an FPGA

2016 ◽  
Vol 11 (01) ◽  
pp. C01046-C01046 ◽  
Author(s):  
C. Ugur ◽  
S. Linev ◽  
J. Michel ◽  
T. Schweitzer ◽  
M. Traxler
Keyword(s):  
High Precision ◽  
Pulse Width ◽  
Novel Approach ◽  
Width Measurements

scholarly journals Verifying Atom Entanglement Schemes by Testing Bell's Inequality

2001 ◽  
Vol 56 (1-2) ◽  
pp. 27-34
Author(s):  
Dimitris G. Angelakis ◽  
Almut Beigea ◽  
Peter L. Knight ◽  
William J. Munro ◽  
Ben Tregenn
Keyword(s):  
Photonic Crystal ◽  
High Precision ◽  
Optical Cavity ◽  
The State ◽  
Entangled States ◽  
Quantum Mechanical ◽  
Bell’S Inequality ◽  
Entangled Photons ◽  
Bell's Inequality ◽  
State Preparation

Abstract Recent experiments to test B ell's inequality using entangled photons and ions aimed at tests of basic quantum mechanical principles. Interesting results have been obtained and many loopholes could be closed. In this paper we want to point out that tests of Bell's inequality also play an important role in verifying atom entanglement schemes. We describe as an example a scheme to prepare arbitrary entangled states of N two-level atoms using a leaky optical cavity and a scheme to entangle atoms inside a photonic crystal. During the state preparation no photons are emitted, and observing a violation of B ell's inequality is the only way to test whether a scheme works with a high precision or not.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

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