scholarly journals Asymmetric polarization-based frequency scanning interferometer

2015 ◽  
Vol 23 (6) ◽  
pp. 7333 ◽  
Author(s):  
Seung Hyun Lee ◽  
Min Young Kim ◽  
Jang-Il Ser ◽  
Jaechan Park
2015 ◽  
Vol 64 (21) ◽  
pp. 219501
Author(s):  
Xu Xin-Ke ◽  
Liu Guo-Dong ◽  
Liu Bing-Guo ◽  
Chen Feng-Dong ◽  
Zhuang Zhi-Tao ◽  
...  

Author(s):  
Thomas M. Moore

In the last decade, a variety of characterization techniques based on acoustic phenomena have come into widespread use. Characteristics of matter waves such as their ability to penetrate optically opaque solids and produce image contrast based on acoustic impedance differences have made these techniques attractive to semiconductor and integrated circuit (IC) packaging researchers.These techniques can be divided into two groups. The first group includes techniques primarily applied to IC package inspection which take advantage of the ability of ultrasound to penetrate deeply and nondestructively through optically opaque solids. C-mode Acoustic Microscopy (C-AM) is a recently developed hybrid technique which combines the narrow-band pulse-echo piezotransducers of conventional C-scan recording with the precision scanning and sophisticated signal analysis capabilities normally associated with the high frequency Scanning Acoustic Microscope (SAM). A single piezotransducer is scanned over the sample and both transmits acoustic pulses into the sample and receives acoustic echo signals from the sample.


2007 ◽  
Vol 78 (12) ◽  
pp. 123103 ◽  
Author(s):  
Alexei A. Tonyushkin ◽  
Adam D. Light ◽  
Michael D. Di Rosa

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