scholarly journals Accurate and simultaneous measurement of thickness and refractive index of thermally evaporated thin organic films by surface plasmon resonance spectroscopy

2014 ◽  
Vol 22 (16) ◽  
pp. 18914 ◽  
Author(s):  
T. Del Rosso ◽  
J. Edicson Hernández Sánchez ◽  
R. Dos Santos Carvalho ◽  
O. Pandoli ◽  
M. Cremona
Keyword(s):  
Refractive Index ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Simultaneous Measurement ◽  
Organic Films ◽  
Resonance Spectroscopy ◽  
Surface Plasmon Resonance Spectroscopy ◽  
Thin Organic Films ◽  
Measurement Of Thickness

Refractive-index and thickness sensitivity in surface plasmon resonance spectroscopy

1999 ◽  
Vol 38 (19) ◽  
pp. 4058 ◽  
Author(s):  
Takuo Akimoto ◽  
Satoshi Sasaki ◽  
Kazunori Ikebukuro ◽  
Isao Karube
Keyword(s):  
Refractive Index ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Resonance Spectroscopy ◽  
Surface Plasmon Resonance Spectroscopy

scholarly journals Algorithm for optical characterization of dielectric gradient index nanofilm by surface plasmon resonance spectroscopy

2021 ◽  
Vol 2091 (1) ◽  
pp. 012067
Author(s):  
A V Anisimov ◽  
I Sh Khasanov
Keyword(s):  
Refractive Index ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Dielectric Materials ◽  
Refractive Index Profile ◽  
Resonance Spectroscopy ◽  
Surface Plasmon Resonance Spectroscopy ◽  
Angular Measurements

Abstract A numerical algorithm for determining the refractive index profiles of gradient nanofilms is proposed. A physical justification for the necessity of using spectroscopic measurements in surface plasmon resonance sensing in addition to angular measurements for the unambiguous reconstruction of the shape of the gradient refractive index profile is given. The proposed approach can be effective for nanofilms made of dielectric materials transparent in the IR and THz range.

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

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