scholarly journals Charge distributions in KTa_1-xNbxO_3 optical beam deflectors formed by voltage application

2014 ◽  
Vol 22 (12) ◽  
pp. 14114 ◽  
Author(s):  
Tadayuki Imai ◽  
Jun Miyazu ◽  
Junya Kobayashi
Keyword(s):  
Optical Beam ◽  
Charge Distributions ◽  
Voltage Application ◽  
Beam Deflectors

Analyses of optical rays in KTN optical beam deflectors for device design

2017 ◽  
Vol 56 (25) ◽  
pp. 7277 ◽  
Author(s):  
Tadayuki Imai ◽  
Masahiro Ueno ◽  
Yuzo Sasaki ◽  
Tadashi Sakamoto
Keyword(s):  
Optical Beam ◽  
Device Design ◽  
Beam Deflectors

scholarly journals Measurement of charge density distributions in KTa_1-xNb_xO_3 optical beam deflectors

2014 ◽  
Vol 4 (5) ◽  
pp. 976 ◽  
Author(s):  
Tadayuki Imai ◽  
Jun Miyazu ◽  
Junya Kobayashi
Keyword(s):  
Charge Density ◽  
Optical Beam ◽  
Density Distributions ◽  
Beam Deflectors

Free-Space Optical Switch Modules Using Risley Optical Beam Deflectors

2006 ◽  
Vol 45 (3A) ◽  
pp. 1658-1660 ◽  
Author(s):  
Takashi Matsui ◽  
Fumikazu Oohira ◽  
Maho Hosogi ◽  
Tsuyoshi Yamamoto
Keyword(s):  
Free Space ◽  
Optical Switch ◽  
Optical Beam ◽  
Free Space Optical ◽  
Beam Deflectors

201. Electrostatic Charge Distributions on Airborne Microorganisms

2000 ◽  
Author(s):  
G. Mainelis ◽  
K. Willeke ◽  
S. Grinshpun ◽  
T. Reponen ◽  
S. Trakumas ◽  
...  
Keyword(s):  
Electrostatic Charge ◽  
Airborne Microorganisms ◽  
Charge Distributions

Charging Potential Measurement of Floating Electrode Modeled on the Arc Shield of Vacuum Interrupter under AC Voltage Application

2021 ◽  
Vol 141 (1) ◽  
pp. 21-26
Author(s):  
Hideaki Fukuda ◽  
Kenta Yamamura ◽  
Issei Fujita ◽  
Ryutaro Kusa ◽  
Yasushi Yamano
Keyword(s):  
Potential Measurement ◽  
Vacuum Interrupter ◽  
Voltage Application ◽  
Floating Electrode

Electromagnetically Driven 2-axis Optical Beam Steering MEMS Mirror and Its Dependence of Actuation on Magnetic Field

2010 ◽  
Vol 130 (4) ◽  
pp. 107-112 ◽  
Author(s):  
Yoshiyuki Watanabe ◽  
Yutaka Abe ◽  
Shinnosuke Iwamatsu ◽  
Seiya Kobayashi ◽  
Yoshiyuki Takahashi ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Beam Steering ◽  
Optical Beam

Comparison of Active and Passive Voltage Contrast for Failure Localization

2007 ◽  
Author(s):  
R. Rosenkranz ◽  
W. Werner
Keyword(s):  
Case Studies ◽  
Optical Beam ◽  
Leakage Currents ◽  
Localization Method ◽  
Voltage Contrast ◽  
Failure Localization

Abstract In many cases of failure localization, passive voltage contrast (PVC) localization method does not work, because it is not possible to charge up conducting structures which supposed to be dark in the SEM and FIB images. The reason for this is leakage currents. In this article, the authors show how they succeeded in overcoming these difficulties by the application of the active voltage contrast (AVC) method as it was described as biased voltage contrast by Campbell and Soden. They identified three main cases where the PVC didn't work but where they succeeded in failure localization with the AVC method. This is illustrated with the use of two case studies. Compared to the optical beam based methods the resolution is much better so a single failing contact of e.g. 70 nm technology can clearly be identified which cannot be done by TIVA or OBIRCH.

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