scholarly journals Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging

2011 ◽  
Vol 19 (22) ◽  
pp. 21333 ◽  
Author(s):  
Joan Vila-Comamala ◽  
Ana Diaz ◽  
Manuel Guizar-Sicairos ◽  
Alexandre Mantion ◽  
Cameron M. Kewish ◽  
...  
Keyword(s):  
High Resolution ◽  
Diffractive Imaging ◽  
Ray Optics ◽  
X Ray ◽  
Coherent Diffractive Imaging

Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging

2011 ◽  
Author(s):  
Joan Vila-Comamala ◽  
Ana Diaz ◽  
Manuel Guizar-Sicairos ◽  
Sergey Gorelick ◽  
Vitaliy A. Guzenko ◽  
...  
Keyword(s):  
Diffractive Imaging ◽  
X Ray ◽  
Coherent Diffractive Imaging ◽  
20 Nm

scholarly journals Polarimetric coherent diffraction imaging on cancer-associated fibroblasts and SARS-CoV-2 viruses

2021 ◽  
Author(s):  
Xiaowen Shi ◽  
Dmitry Karpov ◽  
Zach Barringer ◽  
Elijah Schold ◽  
Demba Sarr ◽  
...  
Keyword(s):  
High Resolution ◽  
Imaging Techniques ◽  
Complex Refractive Index ◽  
Cancer Associated Fibroblasts ◽  
X Rays ◽  
Label Free ◽  
Diffractive Imaging ◽  
Dynamical Interaction ◽  
X Ray ◽  
Coherent Diffractive Imaging

Abstract Simultaneously non-destructive, high resolution, and label-free imaging are of paramount importance for studies of complex biological systems, from viruses to cell cultures. Electron imaging techniques achieve extreme resolution but require slicing the sample to obtain volumetric information. On the other hand, X-rays’ high penetrative ability combined with cryogenic temperatures allows access to high resolution while preserving the sample’s structure. However, both X-ray and electron techniques do not currently allow label-free imaging with tissue specificity. Here, we combine a polarimetric approach with coherent diffractive imaging to reveal new ways to overcome this by mapping variations of anisotropy in the complex refractive index of cellular structures to differentiate between various tissues without chemical labeling. In this article, we demonstrate imaging of cancer-associated fibroblasts using birefringent coherent diffractive imaging with enhanced sensitivity to fibrous structures and their orientation as well as the possibility to differentiate the nucleus of the cell. We also propose a modeled soft X-ray experiment on the SARS-CoV-2 virus to address the possibility of leveraging the polarimetric birefringent contrast to spatially resolve the dynamical interaction of the virus with its host environment. We hope that our approach can open up avenues in the future to map and understand how SARS viruses bind with human epithelial cells.

Coherent diffractive imaging: a new tool for high-resolution X-ray imaging

2008 ◽  
Vol 64 (a1) ◽  
pp. C129-C129
Author(s):  
K.A. Nugent ◽  
G.J. Williams ◽  
B. Abbey ◽  
A.G. Peele ◽  
M. Pfeifer ◽  
...  
Keyword(s):  
High Resolution ◽  
Diffractive Imaging ◽  
X Ray ◽  
Coherent Diffractive Imaging ◽  
X Ray Imaging

scholarly journals Coherent imaging at the diffraction limit

2014 ◽  
Vol 21 (5) ◽  
pp. 1011-1018 ◽  
Author(s):  
Pierre Thibault ◽  
Manuel Guizar-Sicairos ◽  
Andreas Menzel
Keyword(s):  
Three Dimensions ◽  
Coherent Imaging ◽  
Field Methods ◽  
Diffractive Imaging ◽  
Time Resolved ◽  
Full Field ◽  
X Ray ◽  
Coherent Diffractive Imaging ◽  
Time Resolved Imaging

X-ray ptychography, a scanning coherent diffractive imaging technique, holds promise for imaging with dose-limited resolution and sensitivity. If the foreseen increase of coherent flux by orders of magnitude can be matched by additional technological and analytical advances, ptychography may approach imaging speeds familiar from full-field methods while retaining its inherently quantitative nature and metrological versatility. Beyond promises of high throughput, spectroscopic applications in three dimensions become feasible, as do measurements of sample dynamics through time-resolved imaging or careful characterization of decoherence effects.

Tests and characterization of a laterally graded multilayer Montel mirror

2013 ◽  
Vol 21 (1) ◽  
pp. 16-23 ◽  
Author(s):  
K. Mundboth ◽  
J. Sutter ◽  
D. Laundy ◽  
S. Collins ◽  
S. Stoupin ◽  
...  
Keyword(s):  
Experimental Data ◽  
High Resolution ◽  
Ray Tracing ◽  
Multilayer Mirrors ◽  
Ray Optics ◽  
X Ray ◽  
X Ray Scattering ◽  
Photon Source ◽  
Ray Scattering

Multilayers are becoming an increasingly important tool in X-ray optics. The essential parameters to design a pair of laterally graded multilayer mirrors arranged in a Montel-type configuration for use as an X-ray collimating device are provided. The results of X-ray reflectometry tests carried out on the optics in addition to metrology characterization are also shown. Finally, using experimental data and combined with X-ray tracing simulations it is demonstrated that the mirror meets all stringent specifications as required for a novel ultra-high-resolution inelastic X-ray scattering spectrometer at the Advanced Photon Source.

Characterization of x-ray phase vortices by ptychographic coherent diffractive imaging

2014 ◽  
Vol 39 (18) ◽  
pp. 5281 ◽  
Author(s):  
J. Vila-Comamala ◽  
A. Sakdinawat ◽  
M. Guizar-Sicairos
Keyword(s):  
Diffractive Imaging ◽  
X Ray ◽  
Coherent Diffractive Imaging

Three dimensional characterization of laser ablation craters using high resolution X-ray computed tomography

2018 ◽  
Vol 139 ◽  
pp. 75-82 ◽  
Author(s):  
A.H. Galmed ◽  
A. du Plessis ◽  
S.G. le Roux ◽  
E. Hartnick ◽  
H. Von Bergmann ◽  
...  
Keyword(s):  
Computed Tomography ◽  
Laser Ablation ◽  
High Resolution ◽  
Three Dimensional ◽  
X Ray ◽  
X Ray Computed

scholarly journals High-resolution characterization of the forbidden Si 200 and Si 222 reflections

2015 ◽  
Vol 48 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Peter Zaumseil
Keyword(s):  
High Resolution ◽  
Angular Range ◽  
Angular Divergence ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Diffraction Plane ◽  
X Ray ◽  
Sample Orientation ◽  
Plane Sample

The occurrence of the basis-forbidden Si 200 and Si 222 reflections in specular X-ray diffraction ω–2Θ scans is investigated in detail as a function of the in-plane sample orientation Φ. This is done for two different diffractometer types with low and high angular divergence perpendicular to the diffraction plane. It is shown that the reflections appear for well defined conditions as a result of multiple diffraction, and not only do the obtained peaks vary in intensity but additional features like shoulders or even subpeaks may occur within a 2Θ range of about ±2.5°. This has important consequences for the detection and verification of layer peaks in the corresponding angular range.

High Resolution X-Ray Characterization of Sub-Micron Periodic Domain Structures in Lithium Niobate Crystals

2007 ◽  
Vol 352 (1) ◽  
pp. 25-34 ◽  
Author(s):  
M. Bazzan ◽  
N. Argiolas ◽  
C. Sada ◽  
P. Mazzoldi ◽  
S. Grilli ◽  
...  
Keyword(s):  
High Resolution ◽  
Lithium Niobate ◽  
Periodic Domain ◽  
X Ray ◽  
Domain Structures ◽  
Lithium Niobate Crystals

X-ray topo-tomography studies of linear dislocations in silicon single crystals

2018 ◽  
Vol 51 (6) ◽  
pp. 1616-1622 ◽  
Author(s):  
Victor Asadchikov ◽  
Alexey Buzmakov ◽  
Felix Chukhovskii ◽  
Irina Dyachkova ◽  
Denis Zolotov ◽  
...  
Keyword(s):  
Numerical Analysis ◽  
High Resolution ◽  
Single Crystals ◽  
Complete Characterization ◽  
Reconstruction Technique ◽  
Algebraic Reconstruction Technique ◽  
X Ray ◽  
Laboratory Setup ◽  
Simultaneous Algebraic Reconstruction Technique

This article describes complete characterization of the polygonal dislocation half-loops (PDHLs) introduced by scratching and subsequent bending of an Si(111) crystal. The study is based on the X-ray topo-tomography technique using both a conventional laboratory setup and the high-resolution X-ray image-detecting systems at the synchrotron facilities at KIT (Germany) and ESRF (France). Numerical analysis of PDHL images is performed using the Takagi–Taupin equations and the simultaneous algebraic reconstruction technique (SART) tomographic algorithm.

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