scholarly journals Decomposition of radially and azimuthally polarized beams using a circular-polarization and vortex-sensing diffraction grating

2010 ◽  
Vol 18 (7) ◽  
pp. 7173 ◽  
Author(s):  
Ignacio Moreno ◽  
Jeffrey A. Davis ◽  
Isaac Ruiz ◽  
Don M. Cottrell
Keyword(s):  
Circular Polarization ◽  
Diffraction Grating ◽  
Polarized Beams

scholarly journals Circularly-polarized, large-angle reflective deflectors based on periodically patterned cholesteric liquid crystals

2017 ◽  
Vol 3 (1) ◽  
Author(s):  
Junji Kobashi ◽  
Yoshinori Mohri ◽  
Hiroyuki Yoshida ◽  
Masanori Ozaki
Keyword(s):  
Liquid Crystals ◽  
Circular Polarization ◽  
Easy Axis ◽  
Bragg Reflection ◽  
Large Angle ◽  
Diffractive Optical Elements ◽  
Cholesteric Liquid Crystals ◽  
Polarization Holography ◽  
Optical Elements ◽  
Polarized Beams

AbstractPatterned cholesteric liquid crystals enable the fabrication of circular-polarization sensitive, reflective diffractive optical elements based on Bragg reflection. Here we report the fabrication of large-angle reflective deflector, which show deflection angles as large as 48.9°. The devices are fabricated by polarization holography, whereby two orthogonal circular polarized beams are superimposed on a photoalignment layer to create a linear modulation of the orientational easy axis. The devices show high circular-polarization extinction ratios, making them potentially useful as functional reflectors and polarization splitters.

Stretched polymers for X-ray linear and circular polarization

1998 ◽  
Vol 5 (3) ◽  
pp. 744-746
Author(s):  
S. P. Collins
Keyword(s):  
Circular Polarization ◽  
Linear Polarization ◽  
Linear Dichroism ◽  
Polarization Analysis ◽  
X Ray ◽  
Polarized Beams ◽  
Stretched Polymers ◽  
Phase Plates ◽  
Elliptically Polarized ◽  
Potential Use

X-ray linear dichroism at the iodine K-edge of Polaroid H-sheet is explored with a view to using stretched polymers for X-ray linear-polarization analysis. The potential use of such materials as phase plates for generating elliptically polarized beams is also considered.

Uniformity of Magnification from Different Electron Microscopes

1967 ◽  
Vol 25 ◽  
pp. 32-33
Author(s):  
Godfrey C. Hoskins ◽  
V. Williams ◽  
V. Allison
Keyword(s):  
Diffraction Grating ◽  
The Other ◽  
Carbon Replica ◽  
Electron Microscopes ◽  
The Stability

The method demonstrated is an adaptation of a proven procedure for accurately determining the magnification of light photomicrographs. Because of the stability of modern electrical lenses, the method is shown to be directly applicable for providing precise reproducibility of magnification in various models of electron microscopes.A readily recognizable area of a carbon replica of a crossed-line diffraction grating is used as a standard. The same area of the standard was photographed in Phillips EM 200, Hitachi HU-11B2, and RCA EMU 3F electron microscopes at taps representative of the range of magnification of each. Negatives from one microscope were selected as guides and printed at convenient magnifications; then negatives from each of the other microscopes were projected to register with these prints. By deferring measurement to the print rather than comparing negatives, correspondence of magnification of the specimen in the three microscopes could be brought to within 2%.

Shadow Theory of Diffraction Grating: Reciprocity, Symmetry and Average Filter

2014 ◽  
Vol E97.C (10) ◽  
pp. 1036-1040 ◽  
Author(s):  
Junichi NAKAYAMA ◽  
Yasuhiko TAMURA
Keyword(s):  
Diffraction Grating ◽  
Average Filter

Electrodynamic System for Diffraction Radiation Oscillators with Resonant Matching of Diffraction Grating

2008 ◽  
Vol 67 (7) ◽  
pp. 597-607
Author(s):  
M. Yu. Demchenko ◽  
V. S. Myroshnychenko ◽  
Yu. V. Svishchev ◽  
Ye. B. Senkevich
Keyword(s):  
Diffraction Grating ◽  
Diffraction Radiation ◽  
Electrodynamic System
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