scholarly journals Reconstruction of refractive-index distribution in off-axis digital holography optical diffraction tomographic system

2009 ◽  
Vol 17 (16) ◽  
pp. 13758 ◽  
Author(s):  
Tomasz Kozacki ◽  
Rafal Krajewski ◽  
Małgorzata Kujawińska
Keyword(s):  
Refractive Index ◽  
Digital Holography ◽  
Optical Diffraction ◽  
Refractive Index Distribution ◽  
Index Distribution

Investigation of limitations of optical diffraction tomography

2007 ◽  
Vol 15 (2) ◽  
Author(s):  
T. Kozacki ◽  
M. Kujawińska ◽  
P. Kniażewski
Keyword(s):  
Refractive Index ◽  
Dynamic Range ◽  
Tomographic Reconstruction ◽  
Back Propagation ◽  
Reconstruction Algorithm ◽  
Optical Diffraction ◽  
Diffraction Tomography ◽  
Refractive Index Distribution ◽  
Optical Diffraction Tomography ◽  
Index Distribution

AbstractOptical diffraction tomography (ODT) applied to measurement of optical microelements is limited by low dynamic range, i.e., only objects with small deviations of refractive-index distribution can be measured. Therefore in this paper the limitations and errors of ODT are investigated throughout extensive numerical experiments. It is shown that these errors can be reduced by introduction of additional numerical focusing in the tomographic reconstruction algorithm. Additionally, new tomographic reconstruction algorithm using back propagation in reference medium for optical microelements measurement with known design is proposed. This hybrid reconstruction algorithm allows significant extension of ODT applicability in measurement of elements having large deviations of refractive-index distribution.

Refractive Index Distribution and Surface Profile Measurement of Micro-Optics Based on Dual Wavelength Digital Holography

2014 ◽  
Vol 34 (3) ◽  
pp. 0312006
Author(s):  
邓丽军 Deng Lijun ◽  
杨勇 Yang Yong ◽  
石炳川 Shi Bingchuan ◽  
马忠洪 Ma Zhonghong ◽  
盖琦 Ge Qi ◽  
...  
Keyword(s):  
Refractive Index ◽  
Digital Holography ◽  
Surface Profile ◽  
Dual Wavelength ◽  
Profile Measurement ◽  
Refractive Index Distribution ◽  
Index Distribution ◽  
Micro Optics ◽  
Surface Profile Measurement
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