scholarly journals Design optimization of integrated BiDi triplexer optical filter based on planar lightwave circuit

2006 ◽  
Vol 14 (11) ◽  
pp. 4675 ◽  
Author(s):  
Chenglin Xu ◽  
Xiaobin Hong ◽  
Wei-Ping Huang
Keyword(s):  
Design Optimization ◽  
Optical Filter ◽  
Planar Lightwave Circuit ◽  
Planar Lightwave

Reconfigurable OTDM Demultiplexing Using FWM in Highly Nonlinear Fiber and a Tunable Planar Lightwave Circuit

2012 ◽  
Vol 24 (1) ◽  
pp. 13-15 ◽  
Author(s):  
Payman Samadi ◽  
Lawrence R. Chen ◽  
Irina A. Kostko ◽  
Patrick Dumais ◽  
Claire L. Callender ◽  
...  
Keyword(s):  
Highly Nonlinear Fiber ◽  
Highly Nonlinear ◽  
Planar Lightwave Circuit ◽  
Nonlinear Fiber ◽  
Planar Lightwave

High frequency electrical circuits on a planar lightwave circuit platform

1996 ◽  
Vol 14 (5) ◽  
pp. 806-811 ◽  
Author(s):  
S. Mino ◽  
T. Ohyama ◽  
T. Hashimoto ◽  
Y. Akahori ◽  
K. Yoshino ◽  
...  
Keyword(s):  
High Frequency ◽  
Electrical Circuits ◽  
Planar Lightwave Circuit ◽  
Planar Lightwave

Proposal of Compact Optical System Using Planar Lightwave Circuit for Precision Measurement Based on Levitation Mass Method

2010 ◽  
Vol 36 ◽  
pp. 329-336
Author(s):  
Koichi Maru ◽  
Yusaku Fujii
Keyword(s):  
Optical System ◽  
Precision Measurement ◽  
Optical Interferometer ◽  
Planar Surface ◽  
Semiconductor Substrate ◽  
Optical Elements ◽  
Planar Lightwave Circuit ◽  
Planar Lightwave

A method for reducing the size and cost of optical system for precision measurement based on the Levitation Mass Method (LMM) is proposed. In the LMM, a mass levitated using a pneumatic linear bearing with sufficiently small friction is made to collide with the object being tested. The velocity and acceleration of the mass are measured using a compact optical interferometer. The size of the optical system can be drastically reduced by using a planar lightwave circuit (PLC), in which several optical elements are arranged on a planar surface of a silica or semiconductor substrate. Several applications of the PLC to precision measurement will be discussed.

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