Thermal analysis of Super-Resolution Near-Field Phase Change Optical Disk

2003 ◽  
Author(s):  
L.P. Shi ◽  
W.L. Teo ◽  
T.C. Chong ◽  
J.M. Li
Keyword(s):  
Thermal Analysis ◽  
Phase Change ◽  
Near Field ◽  
Super Resolution ◽  
Optical Disk ◽  
Field Phase

A New Structure of Super-Resolution Near-Field Phase-Change Optical Disk with a Sb2Te3Mask Layer

2001 ◽  
Vol 40 (Part 1, No. 3B) ◽  
pp. 1649-1650 ◽  
Author(s):  
Lu Ping Shi ◽  
Tow Chong Chong ◽  
Xiang Shui Miao ◽  
Pik Kee Tan ◽  
Jian Ming Li
Keyword(s):  
Phase Change ◽  
Near Field ◽  
Super Resolution ◽  
Optical Disk ◽  
Field Phase

Investigation on Super-Resolution Near-Field Blu-Ray-Type Phase-Change Optical Disk with Sb2Te3Mask Layer

2005 ◽  
Vol 44 (5B) ◽  
pp. 3615-3619 ◽  
Author(s):  
Luping Shi ◽  
Tong Chong Chong ◽  
Pik Kee Tan ◽  
Jianming Li ◽  
Xiang Hu ◽  
...  
Keyword(s):  
Phase Change ◽  
Near Field ◽  
Super Resolution ◽  
Optical Disk ◽  
Type Phase

Blu-ray Type Super-Resolution Near-Field Phase Change Disk with In2Ge8Sb85Te5Mask Layer

2008 ◽  
Vol 47 (7) ◽  
pp. 6025-6028 ◽  
Author(s):  
Mei Ling Lee ◽  
Xiang Shui Miao ◽  
Lu Ping Shi
Keyword(s):  
Phase Change ◽  
Near Field ◽  
Super Resolution ◽  
Field Phase

Super-Resolution Near-Field Phase Change Disk with Sb70Te30Mask Layer

2004 ◽  
Vol 43 (7B) ◽  
pp. 5001-5005 ◽  
Author(s):  
Luping Shi ◽  
Towchong Chong ◽  
Pik Kee Tan ◽  
Xiang Hu ◽  
Jianming Li ◽  
...  
Keyword(s):  
Phase Change ◽  
Near Field ◽  
Super Resolution ◽  
Field Phase

The FDTD Analysis of Near-Field Response for Microgroove Structure With Standing Wave Illumination for the Realization of Coherent Structured Illumination Microscopy

2021 ◽  
Author(s):  
Yizhao Guan ◽  
Hiromasa Kume ◽  
Shotaro Kadoya ◽  
Masaki Michihata ◽  
Satoru Takahashi
Keyword(s):  
Standing Wave ◽  
Incident Angle ◽  
Near Field ◽  
Super Resolution ◽  
Structured Illumination ◽  
Field Phase ◽  
Structured Illumination Microscopy ◽  
Depth Measurement ◽  
Field Response ◽  
Depth Dependency

Abstract Microstructures are widely used in the manufacture of functional surfaces. An optical-based super-resolution, non-invasive method is preferred for the inspection of surfaces with massive microstructures. The Structured Illumination Microscopy (SIM) uses standing-wave illumination to reach optical super-resolution. Recently, coherent SIM is being studied. It can obtain not only the super-resolved intensity distribution but also the phase and amplitude distribution of the sample surface beyond the diffraction limit. By analysis of the phase-depth dependency, the depth measurement for microgroove structures with coherent SIM is expected. FDTD analysis is applied for observing the near-field response of microgroove under the standing-wave illumination. The near-field phase shows depth dependency in this analysis. Moreover, the effects from microgroove width, the incident angle, and the relative position between the standing-wave peak and center of the microgroove are investigated. It is found the near-field phase change can measure depth until 200 nm (aspect ratio 1) with an error of up to 20.4 nm in the case that the microgroove width is smaller than half of the wavelength.

THE FDTD ANALYSIS OF NEAR-FIELD RESPONSE FOR MICROGROOVE STRUCTURE WITH STANDING WAVE ILLUMINATION FOR THE REALIZATION OF COHERENT STRUCTURED ILLUMINATION MICROSCOPY

2021 ◽  
pp. 1-4
Author(s):  
Yizhao Guan ◽  
Hiromasa Kume ◽  
Shotaro Kadoya ◽  
Masaki Michihata ◽  
Satoru Takahashi
Keyword(s):  
Standing Wave ◽  
Incident Angle ◽  
Near Field ◽  
Super Resolution ◽  
Structured Illumination ◽  
Field Phase ◽  
Structured Illumination Microscopy ◽  
Depth Measurement ◽  
Field Response ◽  
Depth Dependency

Abstract Microstructures are widely used in the manufacture of functional surfaces. An optical-based super-resolution, non-invasive method is preferred for the inspection of surfaces with massive microstructures. The Structured Illumination Microscopy (SIM) uses standing-wave illumination to reach optical super-resolution. Recently, coherent SIM is being studied. It can obtain not only the super-resolved intensity distribution but also the phase and amplitude distribution of the sample surface beyond the diffraction limit. By analysis of the phase-depth dependency, the depth measurement for microgroove structures with coherent SIM is expected. FDTD analysis is applied for observing the near-field response of microgroove under the standing-wave illumination. The near-field phase shows depth dependency in this analysis. Moreover, the effects from microgroove width, the incident angle, and the relative position between the standing-wave peak and center of the microgroove are investigated. It is found the near-field phase change can measure depth until 200 nm (aspect ratio 1) with an error of up to 20.4 nm in the case that the microgroove width is smaller than half of the wavelength.

Near-field phase-change optical recording over 1.2 numerical aperture

1999 ◽  
Author(s):  
Koichiro Kishima ◽  
Yuji Kuroda ◽  
Kimihiro Saito ◽  
Kiyoshi Osato ◽  
Kenji Yamamoto ◽  
...  
Keyword(s):  
Phase Change ◽  
Near Field ◽  
Numerical Aperture ◽  
Optical Recording ◽  
Field Phase

Super-resolution near-field optical disk with a thermal shield layer behind recording layer

2007 ◽  
Author(s):  
L. P. Shi ◽  
T. C. Chong ◽  
J. Y. Sze ◽  
J. M. Li ◽  
X. S. Miao ◽  
...  
Keyword(s):  
Near Field ◽  
Super Resolution ◽  
Optical Disk ◽  
Thermal Shield ◽  
Recording Layer
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