A Polarization Diversity Circuit for Silicon Photonics

2011 ◽  
Author(s):  
Jing Zhang ◽  
Huijuan Zhang ◽  
Shiyi Chen ◽  
Mingbin Yu ◽  
G. Q. Lo ◽  
...  
Keyword(s):  
Silicon Photonics ◽  
Polarization Diversity

scholarly journals $4\times25$ Gbps Polarization Diversity Silicon Photonics Receiver With Transfer Printed III-V Photodiodes

2019 ◽  
Vol 31 (4) ◽  
pp. 287-290 ◽  
Author(s):  
Grigorij Muliuk ◽  
Kasper Van Gasse ◽  
Joris Van Kerrebrouck ◽  
Antonio Jose Trindade ◽  
Brian Corbett ◽  
...  
Keyword(s):  
Silicon Photonics ◽  
Polarization Diversity

scholarly journals A tunable polarization diversity silicon photonics filter

2011 ◽  
Vol 19 (14) ◽  
pp. 13063 ◽  
Author(s):  
Jing Zhang ◽  
Huijuan Zhang ◽  
Shiyi Chen ◽  
Mingbin Yu ◽  
Guo Qiang Lo ◽  
...  
Keyword(s):  
Silicon Photonics ◽  
Polarization Diversity

scholarly journals Broad parameter optimization of polarization-diversity 2D grating couplers for silicon photonics

2013 ◽  
Vol 21 (18) ◽  
pp. 21556 ◽  
Author(s):  
Lee Carroll ◽  
Dario Gerace ◽  
Ilaria Cristiani ◽  
Sylvie Menezo ◽  
Lucio C. Andreani
Keyword(s):  
Parameter Optimization ◽  
Silicon Photonics ◽  
Polarization Diversity ◽  
Grating Couplers

High-Capacity Multi-Stage Operation of Polarization-Diversity Silicon Photonics 8 × 8 Optical Switch

2019 ◽  
Vol 37 (1) ◽  
pp. 131-137 ◽  
Author(s):  
Takayuki Kurosu ◽  
Takashi Inoue ◽  
Keijiro Suzuki ◽  
Satoshi Suda ◽  
Shu Namiki
Keyword(s):  
Silicon Photonics ◽  
Optical Switch ◽  
High Capacity ◽  
Polarization Diversity ◽  
Multi Stage

scholarly journals Nonduplicate Polarization-Diversity 32 × 32 Silicon Photonics Switch Based on a SiN/Si Double-Layer Platform

2020 ◽  
Vol 38 (2) ◽  
pp. 226-232 ◽  
Author(s):  
Keijiro Suzuki ◽  
Shu Namiki ◽  
Hitoshi Kawashima ◽  
Kazuhiro Ikeda ◽  
Ryotaro Konoike ◽  
...  
Keyword(s):  
Double Layer ◽  
Silicon Photonics ◽  
Polarization Diversity

Introduction of a Novel Sample Preparation Technique for the Failure Analysis of Silicon Integrated Photonics Modules

2019 ◽  
Author(s):  
Pradip Sairam Pichumani ◽  
Fauzia Khatkhatay
Keyword(s):  
Sample Preparation ◽  
Failure Analysis ◽  
Silicon Photonics ◽  
Cmos Technology ◽  
Single Step ◽  
Oxide Semiconductor ◽  
Disruptive Technology ◽  
Preparation Technique ◽  
Test Vehicle ◽  
Sample Preparation Technique

Abstract Silicon photonics is a disruptive technology that aims for monolithic integration of photonic devices onto the complementary metal-oxide-semiconductor (CMOS) technology platform to enable low-cost high-volume manufacturing. Since the technology is still in the research and development phase, failure analysis plays an important role in determining the root cause of failures seen in test vehicle silicon photonics modules. The fragile nature of the test vehicle modules warrants the development of new sample preparation methods to facilitate subsequent non-destructive and destructive analysis methods. This work provides an example of a single step sample preparation technique that will reduce the turnaround time while simultaneously increasing the scope of analysis techniques.

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