Vectorial solitons, higher-order localized states and compound states in a single-mirror feedback system

2004 ◽  
Author(s):  
Matthias Pesch ◽  
Edgar Große Westhoff ◽  
Thorsten Ackemann ◽  
Wulfhard Lange
Keyword(s):  
Feedback System ◽  
Higher Order ◽  
Localized States

scholarly journals Exact higher-order bulk-boundary correspondence of corner-localized states

2021 ◽  
Vol 104 (19) ◽  
Author(s):  
Minwoo Jung ◽  
Yang Yu ◽  
Gennady Shvets
Keyword(s):  
Higher Order ◽  
Localized States ◽  
Boundary Correspondence

Degenerate Hopf bifurcations via feedback system theory: Higher-order harmonic balance

1991 ◽  
Vol 46 (5-6) ◽  
pp. 1475-1490 ◽  
Author(s):  
Jorge L. Moiola ◽  
Alfredo Desages ◽  
José Romagnoli
Keyword(s):  
System Theory ◽  
Harmonic Balance ◽  
Feedback System ◽  
Higher Order ◽  
Hopf Bifurcations

scholarly journals Quantum superposition demonstrated higher-order topological bound states in the continuum

2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Yao Wang ◽  
Bi-Ye Xie ◽  
Yong-Heng Lu ◽  
Yi-Jun Chang ◽  
Hong-Fei Wang ◽  
...  
Keyword(s):  
Quantum Dynamics ◽  
Bound States ◽  
Topological Insulators ◽  
Higher Order ◽  
Conclusive Evidence ◽  
Localized States ◽  
Quantum Superposition ◽  
Boundary States ◽  
Superposition States ◽  
The Continuum

AbstractHigher-order topological insulators, as newly found non-trivial materials and structures, possess topological phases beyond the conventional bulk-boundary correspondence. In previous studies, in-gap boundary states such as the corner states were regarded as conclusive evidence for the emergence of higher-order topological insulators. Here, we present an experimental observation of a photonic higher-order topological insulator with corner states embedded into the bulk spectrum, denoted as the higher-order topological bound states in the continuum. Especially, we propose and experimentally demonstrate a new way to identify topological corner states by exciting them separately from the bulk states with photonic quantum superposition states. Our results extend the topological bound states in the continuum into higher-order cases, providing an unprecedented mechanism to achieve robust and localized states in a bulk spectrum. More importantly, our experiments exhibit the advantage of using the time evolution of quantum superposition states to identify topological corner modes, which may shed light on future exploration between quantum dynamics and higher-order topological photonics.

Dual systems for all: Higher-order, role-based relational reasoning as a uniquely derived feature of human cognition

2019 ◽  
Vol 42 ◽  
Author(s):  
Daniel J. Povinelli ◽  
Gabrielle C. Glorioso ◽  
Shannon L. Kuznar ◽  
Mateja Pavlic
Keyword(s):  
Temporal Reasoning ◽  
Higher Order ◽  
Important Case ◽  
Human Cognition ◽  
Relational Reasoning ◽  
Dual Systems ◽  
First Order ◽  
Reasoning System ◽  
Role Based

Abstract Hoerl and McCormack demonstrate that although animals possess a sophisticated temporal updating system, there is no evidence that they also possess a temporal reasoning system. This important case study is directly related to the broader claim that although animals are manifestly capable of first-order (perceptually-based) relational reasoning, they lack the capacity for higher-order, role-based relational reasoning. We argue this distinction applies to all domains of cognition.

Experiments with a scanning tunneling microscope (STM) mounted in a scanning electron microscope (SEM)

1986 ◽  
Vol 44 ◽  
pp. 636-639
Author(s):  
Oliver C. Wells ◽  
Mark E. Welland
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Mechanical Stability ◽  
Tunneling Current ◽  
Feedback System ◽  
Scanning Tunneling ◽  
Surface Profiling ◽  
Close Proximity ◽  
Metal Tip ◽  
Scanning Electron

Scanning tunneling microscopes (STM) exist in two versions. In both of these, a pointed metal tip is scanned in close proximity to the specimen surface by means of three piezos. The distance of the tip from the sample is controlled by a feedback system to give a constant tunneling current between the tip and the sample. In the low-end STM, the system has a mechanical stability and a noise level to give a vertical resolution of between 0.1 nm and 1.0 nm. The atomic resolution STM can show individual atoms on the surface of the specimen.A low-end STM has been put into the specimen chamber of a scanning electron microscope (SEM). The first objective was to investigate technological problems such as surface profiling. The second objective was for exploratory studies. This second objective has already been achieved by showing that the STM can be used to study trapping sites in SiO2.

Quantitative EPMA of nitrogen : A tricky element in the electron-probe microanalyzer

1992 ◽  
Vol 50 (2) ◽  
pp. 1622-1623
Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers
Keyword(s):  
Background Subtraction ◽  
Electron Probe ◽  
Detection System ◽  
Higher Order ◽  
Light Elements ◽  
Strong Suppression ◽  
Electron Probe Microanalyzer ◽  
Quantitative Epma ◽  
Peak Count ◽  
Lead Stearate

Among the ultra-light elements B, C, N, and O nitrogen is the most difficult element to deal with in the electron probe microanalyzer. This is mainly caused by the severe absorption that N-Kα radiation suffers in carbon which is abundantly present in the detection system (lead-stearate crystal, carbonaceous counter window). As a result the peak-to-background ratios for N-Kα measured with a conventional lead-stearate crystal can attain values well below unity in many binary nitrides . An additional complication can be caused by the presence of interfering higher-order reflections from the metal partner in the nitride specimen; notorious examples are elements such as Zr and Nb. In nitrides containing these elements is is virtually impossible to carry out an accurate background subtraction which becomes increasingly important with lower and lower peak-to-background ratios. The use of a synthetic multilayer crystal such as W/Si (2d-spacing 59.8 Å) can bring significant improvements in terms of both higher peak count rates as well as a strong suppression of higher-order reflections.

Effects of Higher-Order Laue Zone reflections on structure images

1993 ◽  
Vol 51 ◽  
pp. 450-451
Author(s):  
H. S. Kim ◽  
S. S. Sheinin
Keyword(s):  
Wave Vector ◽  
Theoretical Calculations ◽  
Reciprocal Lattice ◽  
Image Plane ◽  
Bloch Wave ◽  
Dynamical Theory ◽  
Higher Order ◽  
Lattice Image ◽  
Lattice Vector ◽  
Image Position

The importance of image simulation in interpreting experimental lattice images is well established. Normally, in carrying out the required theoretical calculations, only zero order Laue zone reflections are taken into account. In this paper we assess the conditions for which this procedure is valid and indicate circumstances in which higher order Laue zone reflections may be important. Our work is based on an analysis of the requirements for obtaining structure images i.e. images directly related to the projected potential. In the considerations to follow, the Bloch wave formulation of the dynamical theory has been used.The intensity in a lattice image can be obtained from the total wave function at the image plane is given by: where ϕg(z) is the diffracted beam amplitide given by In these equations,the z direction is perpendicular to the entrance surface, g is a reciprocal lattice vector, the Cg(i) are Fourier coefficients in the expression for a Bloch wave, b(i), X(i) is the Bloch wave excitation coefficient, ϒ(i)=k(i)-K, k(i) is a Bloch wave vector, K is the electron wave vector after correction for the mean inner potential of the crystal, T(q) and D(q) are the transfer function and damping function respectively, q is a scattering vector and the summation is over i=l,N where N is the number of beams taken into account.

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