scholarly journals Combined Atomic Force Microscopy and Photoluminescence Imaging to Increase the Yield of Quantum Dot Photonic Devices

2017 ◽  
Author(s):  
L. Sapienza ◽  
J. Liu ◽  
J.D. Song ◽  
S. Falt ◽  
W. Wegscheider ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Quantum Dot ◽  
Photonic Devices ◽  
Force Microscopy ◽  
Atomic Force

Model of a realistic InP surface quantum dot extrapolated from atomic force microscopy results

2014 ◽  
Vol 25 (19) ◽  
pp. 195201 ◽  
Author(s):  
Daniele Barettin ◽  
Roberta De Angelis ◽  
Paolo Prosposito ◽  
Matthias Auf der Maur ◽  
Mauro Casalboni ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Quantum Dot ◽  
Force Microscopy ◽  
Atomic Force ◽  
Inp Surface

Atomic Force Microscopy and Transmission Electron Microscopy Study of Self-Organized Ordering in Vertically Aligned PbSe Quantum Dot Superlattices

2001 ◽  
Vol 696 ◽  
Author(s):  
A. Raab ◽  
G. Springholz ◽  
R. T. Lechner ◽  
I. Vavra ◽  
H. H. Kang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Quantum Dot ◽  
Force Microscopy ◽  
Self Organized ◽  
Atomic Force ◽  
Transmission Electron ◽  
Lateral Ordering ◽  
Spacer Thickness

AbstractSelf-organized lateral ordering is studied for PbSe/Pb1-xEuxTe quantum dot superlattices as a function of spacer thickness using atomic force microscopy and transmission electron microscopy. It is found that a pronounced hexagonal lateral ordering tendency exist not only for fcc-stacked superlattices but also for those with vertical dot alignment. For the latter case, a best in-plane ordering is observed for Pb1-xEuxTe spacer thicknesses around 160 Å. This is accompanied by a pronounced narrowing of the size distribution to values as low as ±8%. The resulting in-plane dot separations and dot densities are tunable by changes in spacer thickness. Similar marked changes are also found for PbSe dot shape as well as the dot sizes. This provides additional means for the tuning of the optical and electronic properties of the dots.

Transient Hole Trapping in Individual GeSi Quantum Dot Grown on Si(001) Studied by Conductive Atomic Force Microscopy

2008 ◽  
Vol 25 (12) ◽  
pp. 4360-4363 ◽  
Author(s):  
Wu Rong ◽  
Lin Jian-Hui ◽  
Zhang Sheng-Li ◽  
Yang Hong-Bin ◽  
Jiang Zui-Min ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Quantum Dot ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Hole Trapping ◽  
Atomic Force

Nanofabrication of a quantum dot array: Atomic force microscopy of electropolished aluminum

1996 ◽  
Vol 25 (10) ◽  
pp. 1585-1592 ◽  
Author(s):  
R. E. Ricker ◽  
A. E. Miller ◽  
D. -F. Yue ◽  
G. Banerjee ◽  
S. Bandyopadhyay
Keyword(s):  
Atomic Force Microscopy ◽  
Quantum Dot ◽  
Force Microscopy ◽  
Atomic Force

Influence of quantum dots shape approximation on size reconstructed from atomic force microscopy measurements

2009 ◽  
Vol 17 (3) ◽  
Author(s):  
T. Piotrowski ◽  
S. Sikorski
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Quantum Dot ◽  
Size Determination ◽  
Force Microscopy ◽  
Atomic Force ◽  
Growth Plane ◽  
Shape Approximation ◽  
Afm Probe

AbstractIn this work we discuss the influence of the atomic force microscopy (AFM) probe tip geometry and the object — quantum dot form on the quantum dots dimension in the growth plane reconstructed from the AFM measurements. It is shown that ignoring the geometry of the probe tip and the quantum dot leads to significant differences between dimensions obtained from the AFM measurements and the real dimensions. Inaccuracies in QD size determination of the nano-objects from AFM measurements are defined.

Quantum-dot antibody conjugation visualized at the single-molecule scale with high-speed atomic force microscopy

2018 ◽  
Vol 167 ◽  
pp. 267-274 ◽  
Author(s):  
Takayuki Umakoshi ◽  
Hikari Udaka ◽  
Takayuki Uchihashi ◽  
Toshio Ando ◽  
Miho Suzuki ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Quantum Dot ◽  
Single Molecule ◽  
High Speed ◽  
Force Microscopy ◽  
Atomic Force ◽  
Antibody Conjugation

Excited-State Spectroscopy on an Individual Quantum Dot Using Atomic Force Microscopy

Nano Letters ◽  
2012 ◽  
Vol 12 (2) ◽  
pp. 709-713 ◽  
Author(s):  
Lynda Cockins ◽  
Yoichi Miyahara ◽  
Steven D. Bennett ◽  
Aashish A. Clerk ◽  
Peter Grutter
Keyword(s):  
Atomic Force Microscopy ◽  
Excited State ◽  
Quantum Dot ◽  
Force Microscopy ◽  
Atomic Force
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