Linear and Chirped gratings on thin-film waveguides with Focused Ion-Beam milling

2005 ◽  
Author(s):  
Kalyani Chaganti ◽  
Ildar Salakhutdinov ◽  
Ivan Avrutsky ◽  
John Mansfield ◽  
Gregory W. Auner
Keyword(s):  
Thin Film ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Chirped Gratings ◽  
Thin Film Waveguides ◽  
Focused Ion Beam Milling

scholarly journals Sub-micron grating fabrication on hafnium oxide thin-film waveguides with focused ion-beam milling

2006 ◽  
Vol 14 (4) ◽  
pp. 1505 ◽  
Author(s):  
Kalyani Chaganti ◽  
Ildar Salakhutdinov ◽  
Ivan Avrutsky ◽  
Gregory Auner ◽  
John Mansfield
Keyword(s):  
Thin Film ◽  
Hafnium Oxide ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Oxide Thin Film ◽  
Grating Fabrication ◽  
Thin Film Waveguides ◽  
Focused Ion Beam Milling

scholarly journals A streamlined workflow for automated cryo focused ion beam milling

2021 ◽  
pp. 107743
Author(s):  
Sebastian Tacke ◽  
Philipp Erdmann ◽  
Zhexin Wang ◽  
Sven Klumpe ◽  
Michael Grange ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling

Addressable Metal-Ferroelectric-Metal Nanocapacitor Arrays Fabricated by Focused Ion Beam Milling

2012 ◽  
Vol 132 (1) ◽  
pp. 99-106
Author(s):  
Ying Dai ◽  
Lei Yang ◽  
Longhai Wang ◽  
Bin Tian ◽  
Lianying Zou ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling

A study of angular effects in focused ion beam milling of water ice

2008 ◽  
Vol 18 (9) ◽  
pp. 095010 ◽  
Author(s):  
Jing Fu ◽  
Sanjay B Joshi ◽  
Jeffrey M Catchmark
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Water Ice ◽  
Focused Ion Beam Milling

Properties of Individually Addressable Ferroelectric Nanocapacitor Arrays Fabricated by Focused Ion Beam Milling

2013 ◽  
Vol 13 (8) ◽  
pp. 5542-5546 ◽  
Author(s):  
Ying Dai ◽  
Lei Yang ◽  
Longhai Wang ◽  
Lianying Zou ◽  
Bin Tian ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Focused Ion Beam Milling

Quantitative off-axis electron holography of GaAsp-njunctions prepared by focused ion beam milling

2009 ◽  
Vol 233 (1) ◽  
pp. 102-113 ◽  
Author(s):  
D. COOPER ◽  
R. TRUCHE ◽  
A.C. TWITCHETT-HARRISON ◽  
R.E. DUNIN-BORKOWSKI ◽  
P.A. MIDGLEY
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Electron Holography ◽  
Focused Ion Beam Milling
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