Characteristics and applications of high-intensity THz pulses from an electron accelerator

2004 ◽  
Author(s):  
Lawrence Carr
Keyword(s):  
High Intensity ◽  
Electron Accelerator

Demonstration of the superconducting electron accelerator as a high‐intensity high‐resolution device

1973 ◽  
Vol 22 (11) ◽  
pp. 605-607 ◽  
Author(s):  
M.S. McAshan ◽  
K. Mittag ◽  
H.A. Schwettman ◽  
L.R. Suelzle ◽  
J.P. Turneaure
Keyword(s):  
High Resolution ◽  
High Intensity ◽  
Electron Accelerator

Brightness enhancement method for a high-intensity positron beam produced by an electron accelerator

2008 ◽  
Vol 103 (9) ◽  
pp. 094916 ◽  
Author(s):  
Nagayasu Oshima ◽  
Ryoichi Suzuki ◽  
Toshiyuki Ohdaira ◽  
Atsushi Kinomura ◽  
Takamitsu Narumi ◽  
...  
Keyword(s):  
High Intensity ◽  
Electron Accelerator ◽  
Positron Beam ◽  
Brightness Enhancement ◽  
Enhancement Method

The MIT High Duty, High Intensity 400 MeV Linear Electron Accelerator

1967 ◽  
Vol 14 (3) ◽  
pp. 191-196 ◽  
Author(s):  
W. Bertozzi ◽  
J. Haimson ◽  
C. P. Sargent ◽  
W. Turchinetz
Keyword(s):  
High Intensity ◽  
Electron Accelerator ◽  
Linear Electron Accelerator ◽  
Linear Electron

Optical Properties of HVEM Accelerators

1975 ◽  
Vol 33 ◽  
pp. 180-181
Author(s):  
A. Strojnik ◽  
J.W. Scholl ◽  
V. Bevc
Keyword(s):  
Optical Properties ◽  
Electron Accelerator ◽  
Systematic Investigation ◽  
Electron Source ◽  
High Brightness ◽  
The Past ◽  
Wide Range ◽  
Optical Behavior

The electron accelerator, as inserted between the electron source (injector) and the imaging column of the HVEM, is usually a strong lens and should be optimized in order to ensure high brightness over a wide range of accelerating voltages and illuminating conditions. This is especially true in the case of the STEM where the brightness directly determines the highest resolution attainable. In the past, the optical behavior of accelerators was usually determined for a particular configuration. During the development of the accelerator for the Arizona 1 MEV STEM, systematic investigation was made of the major optical properties for a variety of electrode configurations, number of stages N, accelerating voltages, 1 and 10 MEV, and a range of injection voltages ϕ0 = 1, 3, 10, 30, 100, 300 kV).

A New High Intensity Grid Cap for RCA-EMU-3 Electron Microscopes

1968 ◽  
Vol 26 ◽  
pp. 316-317
Author(s):  
George Christov ◽  
Bolivar J. Lloyd
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
High Voltage ◽  
High Intensity ◽  
Electron Gun ◽  
Tungsten Filament ◽  
Fluorescent Screen ◽  
Electron Microscopes ◽  
Pass Through ◽  
Ground Potential

A new high intensity grid cap has been designed for the RCA-EMU-3 electron microscope. Various parameters of the new grid cap were investigated to determine its characteristics. The increase in illumination produced provides ease of focusing on the fluorescent screen at magnifications from 1500 to 50,000 times using an accelerating voltage of 50 KV.The EMU-3 type electron gun assembly consists of a V-shaped tungsten filament for a cathode with a thin metal threaded cathode shield and an anode with a central aperture to permit the beam to course the length of the column. The cathode shield is negatively biased at a potential of several hundred volts with respect to the filament. The electron beam is formed by electrons emitted from the tip of the filament which pass through an aperture of 0.1 inch diameter in the cap and then it is accelerated by the negative high voltage through a 0.625 inch diameter aperture in the anode which is at ground potential.

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