Two-dimensional E-field mapping and high-speed device characterization using the electrooptic sampling technique
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1996 ◽
Vol 28
(7)
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pp. 801-817
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2004 ◽
Vol 43
(No. 4A)
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pp. L489-L491
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2019 ◽
Vol 28
(06)
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pp. 1950106
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2001 ◽
Vol 266
(2-3)
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pp. 231-236
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1995 ◽
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