Nonlinear refractive index at 351 nm by direct measurement and modeling of small-scale self-focusing

1983 ◽  
Author(s):  
W. L. Smith ◽  
W. E. Warren ◽  
C. L. Vercimak ◽  
W. T. White
Keyword(s):  
Refractive Index ◽  
Direct Measurement ◽  
Nonlinear Refractive Index ◽  
Small Scale ◽  
Self Focusing

scholarly journals Nonlinear refractive index of porcine cornea studied by z-scan and self-focusing during femtosecond laser processing

2010 ◽  
Vol 18 (4) ◽  
pp. 3700 ◽  
Author(s):  
M. Miclea ◽  
U. Skrzypczak ◽  
S. Faust ◽  
F. Fankhauser ◽  
H. Graener ◽  
...  
Keyword(s):  
Refractive Index ◽  
Femtosecond Laser ◽  
Nonlinear Refractive Index ◽  
Laser Processing ◽  
Self Focusing ◽  
Femtosecond Laser Processing ◽  
Porcine Cornea

Nonlinear Refractive Index of Silicon Nanoparticles: A Short Review

2014 ◽  
Vol 1 (2) ◽  
pp. 87-97
Author(s):  
Sudakshina Prusty
Keyword(s):  
Refractive Index ◽  
Nonlinear Refractive Index ◽  
Phase Modulation ◽  
Silicon Nanoparticles ◽  
Nonlinear Coefficient ◽  
Short Review ◽  
Self Phase Modulation ◽  
Physical Mechanisms ◽  
Self Focusing ◽  
Physical Phenomena

This article discusses the nonlinear refractive index of silicon nanoparticles starting from the basic formalism to some of the consequent physical phenomena like self focusing and self phase modulation. Several experimental techniques mainly based on Z-scan are discussed to measure the nonlinear refractive index. Another less explored technique for silicon nanoparticles, which studies the far-field optical fringe pattern formed by spatial self-phase modulation, is also discussed. Computation of the nonlinear refractive index is shown in detail by employing these two techniques. While Z-scan can estimate the nonlinear coefficient of a medium in a chosen time scale, the optical fringe method can predict the overall nonlinear refractive index due to all possible physical mechanisms. Some of the recent results for silicon nanoparticles using these two techniques are also discussed.

scholarly journals Studying the Nonlinear Optical Properties of Fluoride Laser Host Materials in the Ultraviolet Wavelength Region

2021 ◽  
Vol 12 (1) ◽  
pp. 372
Author(s):  
Duong Van Pham ◽  
Diep Van Nguyen ◽  
Tu Xuan Nguyen ◽  
Kieu Anh Thi Doan ◽  
Quan Minh Le ◽  
...  
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Ultrashort Pulse ◽  
Nonlinear Refractive Index ◽  
Nonlinear Optical ◽  
Wavelength Region ◽  
Aluminum Fluoride ◽  
Self Focusing ◽  
Host Materials ◽  
Ultraviolet Wavelength

Fluoride host materials doped with trivalent cerium ions have previously been demonstrated as successful laser materials in the ultraviolet wavelength region. However, the nonlinear optical properties of the fluoride hosts in this wavelength region have not been investigated yet, although nonlinearity could result in undesirable effects such as self-focusing and pulse distortion when these fluoride materials are used as gain media in high-power, ultrashort pulse laser oscillator and amplifier systems. In this work, the nonlinear refractive index of lithium calcium aluminum fluoride (LiCaAlF6), lithium strontium aluminum fluoride (LiSrAlF6), lanthanum fluoride (LaF3), and yttrium lithium fluoride (YLiF4) fluoride host materials are determined using the Kramers–Krönig relation model in the ultraviolet wavelength region. Self-focusing conditions, particularly at the peak laser emission wavelength of these materials, are further analyzed. Results show that LiCaAlF6 has the smallest nonlinear refractive index and self-focusing, making it an ideal host material under the conditions of ultrashort pulse and ultrahigh-power laser generation.

scholarly journals Self-focusing of Laser Beams in Cadmium Manganese Telluride Cd0.4Mn0.6Te

1990 ◽  
Vol 43 (3) ◽  
pp. 303 ◽  
Author(s):  
XD Dai ◽  
Y Ito ◽  
YH Ja
Keyword(s):  
Refractive Index ◽  
Nonlinear Refractive Index ◽  
Diluted Magnetic Semiconductor ◽  
Magnetic Semiconductor ◽  
Cadmium Manganese Telluride ◽  
Thermally Induced ◽  
Focusing Effect ◽  
Self Focusing ◽  
Manganese Telluride ◽  
Diluted Magnetic

Laser beam induced self-focusing in a relatively new diluted magnetic semiconductor cadmium manganese telluride (Cdo.4Mno.6Te) has been observed. We found that a thermally-induced change in nonlinear refractive index is the main mechanism responsible for the self-focusing effect. The nonlinear refractive index has been determined using experimental results.

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