Improved method for measuring second-order non-linearity profile in poled silica

1999 ◽  
Author(s):  
Y. Quiquempois ◽  
G. Martinelli ◽  
F. Valentin ◽  
P. Bernage ◽  
P. Niay ◽  
...  
Keyword(s):  
Second Order ◽  
Improved Method

scholarly journals Numerical Study of Mach Reflection and Detonation by Using a Second-Order CE/SE Method

2010 ◽  
Vol 26 (4) ◽  
pp. 465-472
Author(s):  
Deliang Zhang ◽  
S.-M. Liang
Keyword(s):  
Fluid Dynamics ◽  
Shock Waves ◽  
Present Method ◽  
Numerical Study ◽  
Mach Reflection ◽  
Second Order ◽  
Improved Method ◽  
Numerical Examples ◽  
Interaction Problem ◽  
Good Agreement

ABSTRACTAn improved method of space-time conservation element and solution element (CE/SE) is developed to solve the equations of conservation laws in fluid dynamics. The present method substantially differs in both concept and methodology from the traditional CE/SE method. In this paper the improved second-order CE/SE method is presented in a hexahedral grid. Furthermore, the present CE/SE method was successfully applied to solve the interaction problem of shock waves and detonation. Several numerical examples were also given. Numerical results have compared with the results of experiments and other computational methods. The compared results have shown a good agreement. The improved CE/SE method has higher accuracy and becomes a more prospective scheme.

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

An Improved Method for the Preparation and TEM Examination of Sharp Pointed Tips used in APFIM and STM

1990 ◽  
Vol 48 (2) ◽  
pp. 102-103
Author(s):  
E.A. Fischione ◽  
P.E. Fischione ◽  
J.J. Haugh ◽  
M.G. Burke
Keyword(s):  
Atom Probe ◽  
Preparation Process ◽  
Improved Method ◽  
Ion Milling ◽  
Polishing Process ◽  
Probe Field ◽  
Scanning Tunnelling ◽  
Stm Tips ◽  
Tunnelling Microscopy ◽  
Ion Microscopy

A common requirement for both Atom Probe Field-Ion Microscopy (APFIM) and Scanning Tunnelling Microscopy (STM) is a sharp pointed tip for use as either the specimen (APFIM) or the probe (STM). Traditionally, tips have been prepared by either chemical or electropolishing techniques. Recently, ion-milling has been successfully employed in the production of APFIM tips [1]. Conventional electropolishing techniques are applicable to a wide variety of metals, but generally require careful manual adjustments during the polishing process and may also be time-consuming. In order to reduce the time and effort involved in the preparation process, a compact, self-contained polishing unit has been developed. This system is based upon the conventional two-stage electropolishing technique in which the specimen/tip blank is first locally thinned or “necked”, and subsequently electropolished until separation occurs.[2,3] The result of this process is the production of two APFIM or STM tips. A mechanized polishing unit that provides these functions while automatically maintaining alignment has been designed and developed.

Immunoelectron microscopic localization of elastic tissue in archival material using an improved method

1990 ◽  
Vol 48 (3) ◽  
pp. 794-795
Author(s):  
J. C. Fanning ◽  
J. F. White ◽  
R. Polewski ◽  
E. G. Cleary
Keyword(s):  
Normal Animal ◽  
Animal Tissue ◽  
Elastic Tissue ◽  
Human Tissues ◽  
Improved Method ◽  
Tissue Samples ◽  
Archival Material ◽  
Immuno Electron Microscopy ◽  
Arteries And Veins ◽  
Biochemical Examination

Elastic tissue is an important component of the walls of arteries and veins, of skin, of the lungs and in lesser amounts, of many other tissues. It is responsible for the rubber-like properties of the arteries and for the normal texture of young skin. It undergoes changes in a number of important diseases such as atherosclerosis and emphysema and on exposure of skin to sunlight.We have recently described methods for the localizationof elastic tissue components in normal animal and human tissues. In the study of developing and diseased tissues it is often not possible to obtain samples which have been optimally prepared for immuno-electron microscopy. Sometimes there is also a need to examine retrospectively samples collected some years previously. We have therefore developed modifications to our published methods to allow examination of human and animal tissue samples obtained at surgery or during post mortem which have subsequently been: 1. stored frozen at -35° or -70°C for biochemical examination; 2.

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