Ultrahigh speed variable focus lenses for simultaneous multiplane and high depth of field imaging

2015 ◽  
Author(s):  
Ting-Hsuan Chen ◽  
Christian Theriault ◽  
Craig B. Arnold
Keyword(s):  
Depth Of Field ◽  
Variable Focus ◽  
Field Imaging ◽  
High Depth

An extended depth-of-field imaging system with a non-rotationally symmetric phase mask

2018 ◽  
Vol 89 (10) ◽  
pp. 103101 ◽  
Author(s):  
Hongbo Xie ◽  
Lirong He ◽  
Lei Yang ◽  
Chensheng Mao ◽  
Meng Zhu ◽  
...  
Keyword(s):  
Imaging System ◽  
Phase Mask ◽  
Depth Of Field ◽  
Rotationally Symmetric ◽  
Extended Depth Of Field ◽  
Field Imaging ◽  
Symmetric Phase

Alleviating image artifacts in wavefront coding extended depth of field imaging system

2019 ◽  
Vol 436 ◽  
pp. 232-238
Author(s):  
Xutao Mo ◽  
Tao Zhang ◽  
Bin Wang ◽  
Xianshan Huang ◽  
Cuifang Kuang ◽  
...  
Keyword(s):  
Imaging System ◽  
Depth Of Field ◽  
Image Artifacts ◽  
Wavefront Coding ◽  
Extended Depth Of Field ◽  
Field Imaging

scholarly journals Imaging and Analytics on the Helium Ion Microscope

2019 ◽  
Vol 12 (1) ◽  
pp. 523-543 ◽  
Author(s):  
Tom Wirtz ◽  
Olivier De Castro ◽  
Jean-Nicolas Audinot ◽  
Patrick Philipp
Keyword(s):  
Mass Spectra ◽  
Secondary Electron ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Of Field ◽  
3D Images ◽  
Helium Ion ◽  
Scanning Transmission ◽  
Electron Imaging ◽  
Secondary Ion ◽  
High Depth

The helium ion microscope (HIM) has emerged as an instrument of choice for patterning, imaging and, more recently, analytics at the nanoscale. Here, we review secondary electron imaging on the HIM and the various methodologies and hardware components that have been developed to confer analytical capabilities to the HIM. Secondary electron–based imaging can be performed at resolutions down to 0.5 nm with high contrast, with high depth of field, and directly on insulating samples. Analytical methods include secondary electron hyperspectral imaging (SEHI), scanning transmission ion microscopy (STIM), backscattering spectrometry and, in particular, secondary ion mass spectrometry (SIMS). The SIMS system that was specifically designed for the HIM allows the detection of all elements, the differentiation between isotopes, and the detection of trace elements. It provides mass spectra, depth profiles, and 2D or 3D images with lateral resolutions down to 10 nm.

Extended depth-of-field imaging through radially symmetrical conjugate phase masks

2015 ◽  
Vol 54 (11) ◽  
pp. 115103 ◽  
Author(s):  
Shouqian Chen ◽  
Van Nhu Le ◽  
Zhigang Fan ◽  
Hong Cam Tran
Keyword(s):  
Depth Of Field ◽  
Extended Depth Of Field ◽  
Field Imaging

Aspheric optical elements for extended depth-of-field imaging

1995 ◽  
Author(s):  
Joseph van der Gracht ◽  
Edward R. Dowski, Jr. ◽  
W. Thomas Cathey, Jr. ◽  
John P. Bowen
Keyword(s):  
Depth Of Field ◽  
Optical Elements ◽  
Extended Depth Of Field ◽  
Field Imaging

An adaptive depth of field imaging system for micromanipulation

2008 ◽  
Vol 41 (2) ◽  
pp. 14743-14748
Author(s):  
Xiaodong Tao ◽  
Deokhwa Hong ◽  
Hyungsuck Cho
Keyword(s):  
Imaging System ◽  
Depth Of Field ◽  
Field Imaging

High Depth-of-Field Nanostructures by Rotational Near-Field Photolithography

Plasmonics ◽  
2019 ◽  
Vol 15 (1) ◽  
pp. 209-215 ◽  
Author(s):  
Jiaxin Ji ◽  
Pengfei Xu ◽  
Jiying Chen ◽  
Jing Li ◽  
Yonggang Meng
Keyword(s):  
Near Field ◽  
Depth Of Field ◽  
High Depth
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