Ultrahigh speed variable focus lenses for simultaneous multiplane and high depth of field imaging

Author(s):  
Ting-Hsuan Chen ◽  
Christian Theriault ◽  
Craig B. Arnold
2018 ◽  
Vol 89 (10) ◽  
pp. 103101 ◽  
Author(s):  
Hongbo Xie ◽  
Lirong He ◽  
Lei Yang ◽  
Chensheng Mao ◽  
Meng Zhu ◽  
...  

2019 ◽  
Vol 436 ◽  
pp. 232-238
Author(s):  
Xutao Mo ◽  
Tao Zhang ◽  
Bin Wang ◽  
Xianshan Huang ◽  
Cuifang Kuang ◽  
...  

2019 ◽  
Vol 12 (1) ◽  
pp. 523-543 ◽  
Author(s):  
Tom Wirtz ◽  
Olivier De Castro ◽  
Jean-Nicolas Audinot ◽  
Patrick Philipp

The helium ion microscope (HIM) has emerged as an instrument of choice for patterning, imaging and, more recently, analytics at the nanoscale. Here, we review secondary electron imaging on the HIM and the various methodologies and hardware components that have been developed to confer analytical capabilities to the HIM. Secondary electron–based imaging can be performed at resolutions down to 0.5 nm with high contrast, with high depth of field, and directly on insulating samples. Analytical methods include secondary electron hyperspectral imaging (SEHI), scanning transmission ion microscopy (STIM), backscattering spectrometry and, in particular, secondary ion mass spectrometry (SIMS). The SIMS system that was specifically designed for the HIM allows the detection of all elements, the differentiation between isotopes, and the detection of trace elements. It provides mass spectra, depth profiles, and 2D or 3D images with lateral resolutions down to 10 nm.


2015 ◽  
Vol 54 (11) ◽  
pp. 115103 ◽  
Author(s):  
Shouqian Chen ◽  
Van Nhu Le ◽  
Zhigang Fan ◽  
Hong Cam Tran

1995 ◽  
Author(s):  
Joseph van der Gracht ◽  
Edward R. Dowski, Jr. ◽  
W. Thomas Cathey, Jr. ◽  
John P. Bowen

2008 ◽  
Vol 41 (2) ◽  
pp. 14743-14748
Author(s):  
Xiaodong Tao ◽  
Deokhwa Hong ◽  
Hyungsuck Cho

Plasmonics ◽  
2019 ◽  
Vol 15 (1) ◽  
pp. 209-215 ◽  
Author(s):  
Jiaxin Ji ◽  
Pengfei Xu ◽  
Jiying Chen ◽  
Jing Li ◽  
Yonggang Meng
Keyword(s):  

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