Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis
1991 ◽
Vol 82
(5-6)
◽
pp. 425-432
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1996 ◽
Vol 130
(4-6)
◽
pp. 260-266
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2018 ◽
Vol 41
(5)
◽
pp. 1156-1163
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