The impact of threshold assessment methodsin laser-induced damage measurements usingthe example of CCD, CMOS and DMD
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2008 ◽
Vol 281
(14)
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pp. 3802-3805
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1962 ◽
Vol 14
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pp. 169-257
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1997 ◽
Vol 161
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pp. 189-195
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1970 ◽
Vol 28
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pp. 474-475
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