Research of Wavelength Calibration Methods in Laser Wavelength Measurement

2021 ◽  
Author(s):  
Liang Yuan ◽  
Lirong Qiu
1984 ◽  
Vol 23 (21) ◽  
pp. 3862 ◽  
Author(s):  
Mark B Morris ◽  
Thomas J. McIlrath ◽  
James J. Snyder

2015 ◽  
Vol 27 (21) ◽  
pp. 2246-2249 ◽  
Author(s):  
Enmei Shan ◽  
Yi Li ◽  
Ben Xu ◽  
Changyu Shen ◽  
Chunliu Zhao ◽  
...  

2018 ◽  
Vol 30 (13) ◽  
pp. 1186-1189
Author(s):  
Maryam Mohagheghian ◽  
Saeed Ghavami Sabouri

2014 ◽  
Vol 53 (7) ◽  
pp. 074107 ◽  
Author(s):  
Zhaoshuo Tian ◽  
Zhenghe Sun ◽  
Yanchao Zhang ◽  
Shiyou Fu

1993 ◽  
Vol 47 (7) ◽  
pp. 1007-1014 ◽  
Author(s):  
J. Thomas Brownrigg

A wavelength calibration method for low-resolution diode array spectrometers is described. The method was developed for routine calibration of 0.1-meter-focal-distance spectrometers having 35- or 38-element silicon diode arrays, normally operated in the 340–700 nm spectral range. Each diode of the array is approximately 1 mm wide, giving an instrumental bandwidth of ∼10 nm per diode. The calibration method requires two well-separated monochromatic spectral lines, their central image locations on the array, and the grating groove frequency. This method is compared with nonlinear regression (least-squares) methods, with multiple calibration lines fitted to quadratic or cubic polynomials. The predictive accuracy of the wavelength-pair method compares favorably with the regression methods. A calibration accuracy of ∼±1 nm is expected for the instruments considered here. The method described could, in principle, be applied to instruments with higher resolution, such as those having self-scanned photodiode arrays with 25-μm or 50-μm-wide pixels. For such instruments, however, a large number of calibration lines should be resolved. In this case, the regression method, which averages diode position measurement errors, is probably more accurate. The wavelength-pair method is most useful for low-resolution instruments, for which regression methods may not be practical.


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