Enhancement of CASSI by a zero-order image employing a single detector

2021 ◽  
Vol 60 (5) ◽  
pp. 1463
Author(s):  
J. Hlubuček ◽  
J. Lukeš ◽  
J. Václavík ◽  
K. Žídek
Keyword(s):  
Zero Order ◽  
Single Detector ◽  
Order Image

Zero-Order Image Elimination in Digital Hologram Based on Finite Impulse Response Filter

2008 ◽  
Vol 28 (5) ◽  
pp. 856-859 ◽  
Author(s):  
刘雯雯 Liu Wenwen ◽  
戴宜全 Dai Yiquan ◽  
康新 Kang Xin ◽  
杨福俊 Yang Fujun ◽  
何小元 He Xiaoyuan
Keyword(s):  
Impulse Response ◽  
Finite Impulse Response ◽  
Zero Order ◽  
Finite Impulse Response Filter ◽  
Digital Hologram ◽  
Impulse Response Filter ◽  
Order Image

scholarly journals Numerical suppression of zero-order image in digital holography

2007 ◽  
Vol 15 (14) ◽  
pp. 8851 ◽  
Author(s):  
Gu-Liang Chen ◽  
Ching-Yang Lin ◽  
Ming-Kuei Kuo ◽  
Chi-Ching Chang
Keyword(s):  
Digital Holography ◽  
Zero Order ◽  
Order Image

Filter method used to eliminate the zero-order image

2008 ◽  
Author(s):  
Wenwen Liu ◽  
Xin Kang ◽  
Xiaoyuan He
Keyword(s):  
Zero Order ◽  
Filter Method ◽  
Order Image

Suppression of zero-order image in off-axis digital holography based on homomorphic filtering

2012 ◽  
Vol 20 (9) ◽  
pp. 1877-1882
Author(s):  
杨勇 YANG Yong ◽  
薛东旭 XUE Dong-xu ◽  
盖琦 GE Qi ◽  
吴永丽 WU Yong-li ◽  
马忠洪 MA Zhong-hong
Keyword(s):  
Digital Holography ◽  
Zero Order ◽  
Homomorphic Filtering ◽  
Order Image

A Method for Eliminating Zero-Order Image in Digital Holograph Based on Contourlet Transform

2013 ◽  
Vol 760-762 ◽  
pp. 80-83
Author(s):  
Yu Fei Zhang ◽  
Yi Quan Wu
Keyword(s):  
Digital Holography ◽  
Low Frequency ◽  
Zero Order ◽  
Contourlet Transform ◽  
Image Method ◽  
Real Image ◽  
Reconstruction Process ◽  
Frequency Domain Filtering ◽  
Order Image

In the reconstruction process of digital holograph, zero-order image has a bad impact on the quality of real image. In this paper, a new way to eliminate zero-order image in digital holography is proposed. Firstly, digital holography image is decomposed by contourlet transform, then remove the low frequency. The new digital holography image is obtained by inverse contourlet transform. Experiments show that, compared with spatial filtering, frequency domain filtering, laplacian filtering and eliminate zero-order image method based on wavelet, the new method proposed in this paper can eliminate zero-order image better, whats more, the real image is also strengthened in some way.

scholarly journals Multiple Images in Reflecting Microscopes

1955 ◽  
Vol 8 (1) ◽  
pp. 186
Author(s):  
WH Steel
Keyword(s):  
Higher Order ◽  
Zero Order ◽  
Mirror System ◽  
Image Point ◽  
Mirror Surface ◽  
Light Path ◽  
Multiple Images ◽  
Normal Image ◽  
Order Image ◽  
Central Obscuration

The normal image of a reflecting microscope is formed by a single reflection at each mirror surface. However, other images are possible ; higher order images formed by two or more reflections at each surface, and a zero order "image" which is the object itself, if there is an unobstructed light path through the system. In a mirror system possessing central obscuration of the pupil, this unwanted light usually does not reach the axial image point, but it may give rise to a spread of light across the outer parts of the field, so reducing the contrast. The effects of these extra images are most noticeable when the objective is used in reverse as a condenser.

Strain measurement in In0.2Ga0.8As/GaAs quantum wires by convergent beam electron diffraction

1995 ◽  
Vol 53 ◽  
pp. 444-445
Author(s):  
S. Hillyard ◽  
Y.-P. Chen ◽  
J.D. Reed ◽  
W.J. Schaff ◽  
L.F. Eastman ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Semiconductor Lasers ◽  
Quantum Wire ◽  
Quantum Wires ◽  
Convergent Beam Electron Diffraction ◽  
Zero Order ◽  
Beam Electron ◽  
Local Lattice ◽  
Device Applications ◽  
Convergent Beam

The positions of high-order Laue zone (HOLZ) lines in the zero order disc of convergent beam electron diffraction (CBED) patterns are extremely sensitive to local lattice parameters. With proper care, these can be measured to a level of one part in 104 in nanometer sized areas. Recent upgrades to the Cornell UHV STEM have made energy filtered CBED possible with a slow scan CCD, and this technique has been applied to the measurement of strain in In0.2Ga0.8 As wires.Semiconductor quantum wire structures have attracted much interest for potential device applications. For example, semiconductor lasers with quantum wires should exhibit an improvement in performance over quantum well counterparts. Strained quantum wires are expected to have even better performance. However, not much is known about the true behavior of strain in actual structures, a parameter critical to their performance.

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