Error self-correction method for phase jump in multifrequency phase-shifting structured light

2021 ◽  
Author(s):  
Ji Li ◽  
Jingtian Guan ◽  
HUI DU ◽  
Juntong Xi
Keyword(s):  
Structured Light ◽  
Correction Method ◽  
Phase Shifting ◽  
Phase Jump

Gamma Correction Method Based on Phase-shifting Keying

2021 ◽  
Author(s):  
Yucheng Liao ◽  
Shiqian Wu ◽  
Gaoxu Deng ◽  
Bin Chen ◽  
Jie Li
Keyword(s):  
Correction Method ◽  
Phase Shifting ◽  
Gamma Correction

Period Coded Phase Shifting Strategy for Real–time 3-D Structured Light Illumination

2011 ◽  
Vol 20 (11) ◽  
pp. 3001-3013 ◽  
Author(s):  
Yongchang Wang ◽  
Kai Liu ◽  
Qi Hao ◽  
Daniel L. Lau ◽  
Laurence G. Hassebrook
Keyword(s):  
Real Time ◽  
Structured Light ◽  
Phase Shifting ◽  
Light Illumination ◽  
Structured Light Illumination ◽  
Shifting Strategy

A fast and accurate calibration method for the structured light system based on trapezoidal phase-shifting pattern

Optik ◽  
2014 ◽  
Vol 125 (18) ◽  
pp. 5249-5253 ◽  
Author(s):  
Fengkai Ke ◽  
Jingming Xie ◽  
Youping Chen ◽  
Dailin Zhang ◽  
Bing Chen
Keyword(s):  
Structured Light ◽  
Calibration Method ◽  
Phase Shifting ◽  
Light System ◽  
Structured Light System

A New Three-Dimensional Profilometer for Surface Profile Measurement Using Digital Fringe Projection and Phase Shifting

2005 ◽  
Vol 295-296 ◽  
pp. 471-476
Author(s):  
Liang Chia Chen ◽  
S.H. Tsai ◽  
Kuang Chao Fan
Keyword(s):  
High Speed ◽  
Structured Light ◽  
Three Dimensional ◽  
Surface Profile ◽  
Phase Shifting ◽  
Fringe Projection ◽  
Surface Measurement ◽  
Profile Measurement ◽  
Digital Fringe Projection ◽  
Fringe Patterns

The development of a three-dimensional surface profilometer using digital fringe projection technology and phase-shifting principle is presented. Accurate and high-speed three-dimensional profile measurement plays a key role in determining the success of process automation and productivity. By integrating a digital micromirror device (DMD) with the developed system, exclusive advantages in projecting flexible and accurate structured-light patterns onto the object surface to be measured can be obtained. Furthermore, the developed system consists of a specially designed micro-projecting optical unit for generating flexibly optimal structured-light to accommodate requirements in terms of measurement range and resolution. Its wide angle image detection design also improves measurement resolution for detecting deformed fringe patterns. This resolves the problem in capturing effective deformed fringe patterns for phase shifting, especially when a coaxial optical layout of a stereomicroscope is employed. Experimental results verified that the maximum error was within a reasonable range of the measured depth. The developed system and the method can provide a useful and effective tool for 3D full field surface measurement ranging from µm up to cm scale.

scholarly journals STRUCTURED LIGHT BASED 3D SCANNING FOR SPECULAR SURFACE BY THE COMBINATION OF GRAY CODE AND PHASE SHIFTING

2016 ◽  
Vol XLI-B3 ◽  
pp. 137-142
Author(s):  
Yujia Zhang ◽  
Alper Yilmaz
Keyword(s):  
High Frequency ◽  
Structured Light ◽  
Gray Code ◽  
3D Scanning ◽  
Phase Shifting ◽  
Scanning System ◽  
High Quality ◽  
Specular Surface ◽  
Combination Technique ◽  
Indirect Illumination

Surface reconstruction using coded structured light is considered one of the most reliable techniques for high-quality 3D scanning. With a calibrated projector-camera stereo system, a light pattern is projected onto the scene and imaged by the camera. Correspondences between projected and recovered patterns are computed in the decoding process, which is used to generate 3D point cloud of the surface. However, the indirect illumination effects on the surface, such as subsurface scattering and interreflections, will raise the difficulties in reconstruction. In this paper, we apply maximum min-SW gray code to reduce the indirect illumination effects of the specular surface. We also analysis the errors when comparing the maximum min-SW gray code and the conventional gray code, which justifies that the maximum min-SW gray code has significant superiority to reduce the indirect illumination effects. To achieve sub-pixel accuracy, we project high frequency sinusoidal patterns onto the scene simultaneously. But for specular surface, the high frequency patterns are susceptible to decoding errors. Incorrect decoding of high frequency patterns will result in a loss of depth resolution. Our method to resolve this problem is combining the low frequency maximum min-SW gray code and the high frequency phase shifting code, which achieves dense 3D reconstruction for specular surface. Our contributions include: (i) A complete setup of the structured light based 3D scanning system; (ii) A novel combination technique of the maximum min-SW gray code and phase shifting code. First, phase shifting decoding with sub-pixel accuracy. Then, the maximum min-SW gray code is used to resolve the ambiguity resolution. According to the experimental results and data analysis, our structured light based 3D scanning system enables high quality dense reconstruction of scenes with a small number of images. Qualitative and quantitative comparisons are performed to extract the advantages of our new combined coding method.

Embossed imaging technology based on phase-shifting structured light illumination

2017 ◽  
Vol 38 (3) ◽  
pp. 542-548
Author(s):  
Liu Shuqin ◽  
Zhong Jingang ◽  
Ma Xiao ◽  
Zhang Zibang ◽  
Li Ying
Keyword(s):  
Structured Light ◽  
Phase Shifting ◽  
Light Illumination ◽  
Imaging Technology ◽  
Structured Light Illumination

Surface Profile Measurement of Coal Based on Structured Light Multifrequency Phase-Shifting Technique

2019 ◽  
Vol 56 (4) ◽  
pp. 041102
Author(s):  
吴庆尉 Wu Qingwei ◽  
范海东 Fan Haidong ◽  
关键 Guan Jian ◽  
吴迎春 Wu Yingchun ◽  
吴学成 Wu Xuecheng
Keyword(s):  
Structured Light ◽  
Surface Profile ◽  
Phase Shifting ◽  
Profile Measurement ◽  
Phase Shifting Technique ◽  
Surface Profile Measurement
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