Design and analysis of full-scale scanning system for curved glass based on motion and 3D features

2020 ◽  
Vol 59 (29) ◽  
pp. 9195
Author(s):  
Peng Wang ◽  
Yulin Fan ◽  
Guodong Chen ◽  
Wenzheng Chi ◽  
Zhenhua Wang ◽  
...  
Keyword(s):  
Full Scale ◽  
Scanning System ◽  
Curved Glass

scholarly journals Computational prediction of out-of-plane welding distortion and experimental investigation

2005 ◽  
Vol 40 (2) ◽  
pp. 161-176 ◽  
Author(s):  
D Camilleri ◽  
T Comlekci ◽  
T. G. F Gray
Keyword(s):  
Finite Element ◽  
Full Scale ◽  
Welding Distortion ◽  
Scanning System ◽  
Good Prediction ◽  
Initial Shape ◽  
Out Of Plane ◽  
Thermal Transient ◽  
Full Scale Tests ◽  
Plane Deformations

The main aim of the work was to investigate a simplified finite element simulation of the out-of-plane distortion caused by fusion butt welding. The thermal transient part of the simulation made use of a finite element analysis of the two-dimensional cross-section of the weld joint and the thermoelastic-plastic treatment was based on analytical algorithms describing transverse and longitudinal deformations, leading to predictions of transverse angular deformation and longitudinal contraction force. These results were then applied to a non-linear elastic finite element model to provide predictions of the final angular and overall deformations of the butt-welded plates. The validity of the simulation was investigated via full-scale tests on 4m x 1.4m x 5 mm steel plates, butt welded using a flux-cored Ar-CO2 metal-inert gas process. Thermography and thermocouple arrays were used to validate the thermal transient computations and out-of-plane deformations were measured using displacement transducers for transient deformations and a laser scanning system to measure the profiles of the whole plates before and after welding. The results of six full-scale tests are given and comparison with the simulations shows that the procedure provides good prediction of the angular and overall out-of-plane deformations. Prediction accuracy requires account to be taken of initial shape, gravity loading, and support conditions.

scholarly journals Correction of Scanning Steps to Improve Accuracy in Interferometric Profilometer

2015 ◽  
Vol 15 (1) ◽  
pp. 9-12
Author(s):  
E. Sysoev ◽  
R. Kulikov ◽  
I. Vykhristyuk ◽  
Yu. Chugui
Keyword(s):  
Measurement Error ◽  
Phase Shift ◽  
Full Scale ◽  
External Factors ◽  
Scanning System ◽  
Air Turbulence ◽  
Shift Performance ◽  
Improve Accuracy

Abstract In scanning interferometry of longitudinal shift, an uncertainty of required phase shift performance leads to a measurement error. Such uncertainty can be caused by external factors (vibrations, air turbulence in measuring area etc.) as well as inaccuracy of the scanning system. The method for calculating the phase shift between interferograms, which allows reducing the measurement error, is proposed. The results of numerical and full scale experiments are presented.

Tandem scanning confocal light microscopy as compared with x-ray diffraction for characterizing the behavior of clays in fluid-saturated petroleum reservoir rock

1989 ◽  
Vol 47 ◽  
pp. 148-149
Author(s):  
C.J. Stuart ◽  
B.E. Viani ◽  
J. Walker ◽  
T.H. Levesque
Keyword(s):  
Light Microscopy ◽  
Image Plane ◽  
Reservoir Rock ◽  
Depth Of Field ◽  
Objective Lens ◽  
Scanning System ◽  
Light Sources ◽  
Petroleum Reservoir ◽  
Image Recording ◽  
Scan Speed

Many techniques of imaging used to characterize petroleum reservoir rocks are applied to dehydrated specimens. In order to directly study behavior of fines in reservoir rock at conditions similar to those found in-situ these materials need to be characterized in a fluid saturated state.Standard light microscopy can be used on wet specimens but depth of field and focus cannot be obtained; by using the Tandem Scanning Confocal Microscope (TSM) images can be produced from thin focused layers with high contrast and resolution. Optical sectioning and extended focus images are then produced with the microscope. The TSM uses reflected light, bulk specimens, and wet samples as opposed to thin section analysis used in standard light microscopy. The TSM also has additional advantages: the high scan speed, the ability to use a variety of light sources to produce real color images, and the simple, small size scanning system. The TSM has frame rates in excess of normal TV rates with many more lines of resolution. This is accomplished by incorporating a method of parallel image scanning and detection. The parallel scanning in the TSM is accomplished by means of multiple apertures in a disk which is positioned in the intermediate image plane of the objective lens. Thousands of apertures are distributed in an annulus, so that as the disk is spun, the specimen is illuminated simultaneously by a large number of scanning beams with uniform illumination. The high frame speeds greatly simplify the task of image recording since any of the normally used devices such as photographic cameras, normal or low light TV cameras, VCR or optical disks can be used without modification. Any frame store device compatible with a standard TV camera may be used to digitize TSM images.

X-ray mapping without STEM

1994 ◽  
Vol 52 ◽  
pp. 508-509
Author(s):  
Judith M. Brock ◽  
Max T. Otten
Keyword(s):  
Life Science ◽  
Materials Science ◽  
Chemical Elements ◽  
Full Description ◽  
Scanning System ◽  
Elemental Distribution ◽  
X Ray ◽  
Transmission Electron ◽  
Distribution Of Elements ◽  
Made In

A knowledge of the distribution of chemical elements in a specimen is often highly useful. In materials science specimens features such as grain boundaries and precipitates generally force a certain order on mental distribution, so that a single profile away from the boundary or precipitate gives a full description of all relevant data. No such simplicity can be assumed in life science specimens, where elements can occur various combinations and in different concentrations in tissue. In the latter case a two-dimensional elemental-distribution image is required to describe the material adequately. X-ray mapping provides such of the distribution of elements.The big disadvantage of x-ray mapping hitherto has been one requirement: the transmission electron microscope must have the scanning function. In cases where the STEM functionality – to record scanning images using a variety of STEM detectors – is not used, but only x-ray mapping is intended, a significant investment must still be made in the scanning system: electronics that drive the beam, detectors for generating the scanning images, and monitors for displaying and recording the images.

Relation of Statistically Significant, Abnormal, and Typical WAIS-R VIQ-PIQ Discrepancies to Full Scale IQs

2000 ◽  
Vol 16 (2) ◽  
pp. 107-114 ◽  
Author(s):  
Louis M. Hsu ◽  
Judy Hayman ◽  
Judith Koch ◽  
Debbie Mandell
Keyword(s):  
Graphical Method ◽  
The United States ◽  
Full Scale ◽  
True Score ◽  
Absolute Value ◽  
Normative Population ◽  
The Us ◽  
The Mean ◽  
And Performance ◽  
Quadratic Models

Summary: In the United States' normative population for the WAIS-R, differences (Ds) between persons' verbal and performance IQs (VIQs and PIQs) tend to increase with an increase in full scale IQs (FSIQs). This suggests that norm-referenced interpretations of Ds should take FSIQs into account. Two new graphs are presented to facilitate this type of interpretation. One of these graphs estimates the mean of absolute values of D (called typical D) at each FSIQ level of the US normative population. The other graph estimates the absolute value of D that is exceeded only 5% of the time (called abnormal D) at each FSIQ level of this population. A graph for the identification of conventional “statistically significant Ds” (also called “reliable Ds”) is also presented. A reliable D is defined in the context of classical true score theory as an absolute D that is unlikely (p < .05) to be exceeded by a person whose true VIQ and PIQ are equal. As conventionally defined reliable Ds do not depend on the FSIQ. The graphs of typical and abnormal Ds are based on quadratic models of the relation of sizes of Ds to FSIQs. These models are generalizations of models described in Hsu (1996) . The new graphical method of identifying Abnormal Ds is compared to the conventional Payne-Jones method of identifying these Ds. Implications of the three juxtaposed graphs for the interpretation of VIQ-PIQ differences are discussed.

A Modification of the Payne-Jones Method of Identifying Abnormal Differences in WISC-R Performance and Verbal IQ's

1996 ◽  
Vol 12 (1) ◽  
pp. 27-32 ◽  
Author(s):  
Louis M. Hsu
Keyword(s):  
Full Scale ◽  
True Score ◽  
Verbal Iq ◽  
Score Difference ◽  
The Difference ◽  
And Performance

The difference (D) between a person's Verbal IQ (VIQ) and Performance IQ (PIQ) has for some time been considered clinically meaningful ( Kaufman, 1976 , 1979 ; Matarazzo, 1990 , 1991 ; Matarazzo & Herman, 1985 ; Sattler, 1982 ; Wechsler, 1984 ). Particularly useful is information about the degree to which a difference (D) between scores is “abnormal” (i.e., deviant in a standardization group) as opposed to simply “reliable” (i.e., indicative of a true score difference) ( Mittenberg, Thompson, & Schwartz, 1991 ; Silverstein, 1981 ; Payne & Jones, 1957 ). Payne and Jones (1957) proposed a formula to identify “abnormal” differences, which has been used extensively in the literature, and which has generally yielded good approximations to empirically determined “abnormal” differences ( Silverstein, 1985 ; Matarazzo & Herman, 1985 ). However applications of this formula have not taken into account the dependence (demonstrated by Kaufman, 1976 , 1979 , and Matarazzo & Herman, 1985 ) of Ds on Full Scale IQs (FSIQs). This has led to overestimation of “abnormality” of Ds of high FSIQ children, and underestimation of “abnormality” of Ds of low FSIQ children. This article presents a formula for identification of abnormal WISC-R Ds, which overcomes these problems, by explicitly taking into account the dependence of Ds on FSIQs.

Validation of the Neeswood PBSD Procedure: Testing of a Full-Scale Six-Story Building at Japan's E-Defense

2010 ◽  
Author(s):  
J. W. van de Lindt ◽  
S. Pei ◽  
Steve Pryor ◽  
Hidemaru Shimizu ◽  
Izumi Nakamura
Keyword(s):  
Full Scale ◽  
Story Building
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