Quantitative analysis of analytical elements in Al-In-Sn-O thin film based on comprehensive calibration curves using picosecond laser-induced breakdown spectroscopy
2019 ◽
Vol 160
◽
pp. 105684
◽
2017 ◽
Vol 32
(7)
◽
pp. 1378-1387
◽
2019 ◽
Vol 160
◽
pp. 105689
◽
2017 ◽
Vol 32
(6)
◽
pp. 1166-1176
◽