Generalized circuit model for analysis of extraordinary transmission in multilevel slits

2020 ◽  
Vol 59 (21) ◽  
pp. 6271
Author(s):  
Seyyed Pouriya Kashfi ◽  
Zahra Ghattan Kashani
Keyword(s):  
Circuit Model ◽  
Extraordinary Transmission

A Circuit Model for Lightning Surge of Wind Turbine Tower with an Internal Conductor

2015 ◽  
Vol 135 (3) ◽  
pp. 200-206 ◽  
Author(s):  
Yoki Ikeda ◽  
Naoto Nagaoka ◽  
Yoshihiro Baba
Keyword(s):  
Wind Turbine ◽  
Circuit Model ◽  
Wind Turbine Tower

An Equivalent Circuit Model for Vertical Comb Drive MEMS Optical Scanner Controlled by Pulse Width Modulation

2012 ◽  
Vol 132 (1) ◽  
pp. 1-9 ◽  
Author(s):  
Satoshi Maruyama ◽  
Muneki Nakada ◽  
Makoto Mita ◽  
Takuya Takahashi ◽  
Hiroyuki Fujita ◽  
...  
Keyword(s):  
Equivalent Circuit ◽  
Pulse Width ◽  
Pulse Width Modulation ◽  
Equivalent Circuit Model ◽  
Circuit Model ◽  
Comb Drive ◽  
Optical Scanner

Metal Bridge Defects Localization by a Tiny Leakage between One of Bridged Signals and VDD (GND)

2014 ◽  
Author(s):  
Chunlei Wu ◽  
Suying Yao
Keyword(s):  
Circuit Model ◽  
Functional Modules ◽  
Semiconductor Technology ◽  
Simple Circuit ◽  
Lock In

Abstract As semiconductor technology continues to advance to smaller dimensions and more complex circuit designs, it is becoming more challenging to locate the resistive short directly between two metal lines (signals) due to a metal bridge defect. Especially these two metal lines are very long and relevant to many functional modules. After studying the failed circuit model, we found there should be a tiny leakage between one of the bridged signals and one of common power signals (such as VDD and GND) on a failed IC compared with the reference one, if there is a metal bridge defect between these two bridged signals. The tiny leakage between one of the bridged signals and one of power signals is an indirect leakage that is a mapping of the direct resistive short between these two bridged signals. The metal bridge defect could be pinpointed with the tiny leakage between one of the bridged signals and one of power signals by Lock-in IR-OBIRCH. It is an easier and faster way to locate the metal bridge defects. In this paper, the basic and simple circuit model with a metal bridge defect will be presented and two cases will be studied to demonstrate how to localize a metal bridge defect by the tiny leakage between one of the bridged signals and one of power signals.

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