Advanced iterative algorithm for phase calibration of spatial light modulators integrated in optical instrumentation in a vibration environment

2020 ◽  
Vol 59 (22) ◽  
pp. 6760
Author(s):  
Manuel Silva-López ◽  
Néstor Uribe-Patarroyo ◽  
Alberto Álvarez-Herrero
Keyword(s):  
Iterative Algorithm ◽  
Spatial Light Modulators ◽  
Optical Instrumentation ◽  
Light Modulators ◽  
Phase Calibration

scholarly journals Phase calibration of spatial light modulators by means of Fresnel images

2009 ◽  
Vol 11 (12) ◽  
pp. 125405 ◽  
Author(s):  
Ll Martínez-León ◽  
Z Jaroszewicz ◽  
A Kołodziejczyk ◽  
V Durán ◽  
E Tajahuerce ◽  
...  
Keyword(s):  
Spatial Light Modulators ◽  
Light Modulators ◽  
Phase Calibration

scholarly journals Progress in Phase Calibration for Liquid Crystal Spatial Light Modulators

2019 ◽  
Vol 9 (10) ◽  
pp. 2012 ◽  
Author(s):  
Rujia Li ◽  
Liangcai Cao
Keyword(s):  
Optical Tweezers ◽  
Phase Modulation ◽  
Spatial Light Modulators ◽  
Light Modulator ◽  
Holographic Display ◽  
Light Modulators ◽  
Interferometric Phase ◽  
Calibration Methods ◽  
Phase Calibration ◽  
Potential Methods

Phase-only Spatial Light Modulator (SLM) is one of the most widely used devices for phase modulation. It has been successfully applied in the field with requirements of precision phase modulation such as holographic display, optical tweezers, lithography, etc. However, due to the limitations in the manufacturing process, the grayscale-phase response could be different for every single SLM device, even varying on sections of an SLM panel. A diverse array of calibration methods have been proposed and could be sorted into two categories: the interferometric phase calibration methods and the diffractive phase calibration methods. The principles of phase-only SLM are introduced. The main phase calibration methods are discussed and reviewed. The advantages of these methods are analyzed and compared. The potential methods for different applications are suggested.

scholarly journals Diffraction-Based Phase Calibration of Spatial Light Modulators With Binary Phase Fresnel Lenses

2016 ◽  
Vol 12 (10) ◽  
pp. 1027-1032 ◽  
Author(s):  
Omel Mendoza-Yero ◽  
Gladys Minguez-Vega ◽  
Lluis Martinez-Leon ◽  
Miguel Carbonell-Leal ◽  
Mercedes Fernandez-Alonso ◽  
...  
Keyword(s):  
Spatial Light Modulators ◽  
Binary Phase ◽  
Light Modulators ◽  
Phase Calibration ◽  
Fresnel Lenses

scholarly journals Interferometric method for phase calibration in liquid crystal spatial light modulators using a self-generated diffraction-grating

2016 ◽  
Vol 24 (13) ◽  
pp. 14159 ◽  
Author(s):  
José Luis Martínez Fuentes ◽  
Enrique J. Fernández ◽  
Pedro M. Prieto ◽  
Pablo Artal
Keyword(s):  
Liquid Crystal ◽  
Diffraction Grating ◽  
Spatial Light Modulators ◽  
Interferometric Method ◽  
Light Modulators ◽  
Phase Calibration

Phase calibration of spatially nonuniform spatial light modulators

2004 ◽  
Vol 43 (35) ◽  
pp. 6400 ◽  
Author(s):  
Xiaodong Xun ◽  
Robert W. Cohn
Keyword(s):  
Spatial Light Modulators ◽  
Light Modulators ◽  
Phase Calibration

Pixel-addressable phase calibration of spatial light modulators: a common-path phase-shifting interferometric microscopy approach

2017 ◽  
Vol 19 (12) ◽  
pp. 125701 ◽  
Author(s):  
Jianpei Xia ◽  
Chenliang Chang ◽  
Zhaozhong Chen ◽  
Zheyuan Zhu ◽  
Tingting Zeng ◽  
...  
Keyword(s):  
Phase Shifting ◽  
Spatial Light Modulators ◽  
Common Path ◽  
Light Modulators ◽  
Phase Calibration

Giant Anisotropy of Conductivity in Hydrogenated Nanocrystalline Silicon Thin Films

1998 ◽  
Vol 536 ◽  
Author(s):  
A. B. Pevtsov ◽  
N. A. Feoktistov ◽  
V. G. Golubev
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Percolation Theory ◽  
Nanocrystalline Silicon ◽  
Spatial Light Modulators ◽  
Light Emitting ◽  
Light Modulators ◽  
Silicon Thin Films ◽  
Longitudinal Conductivity ◽  
Transverse Conductivity

AbstractThin (<1000 Å) hydrogenated nanocrystalline silicon films are widely used in solar cells, light emitting diodes, and spatial light modulators. In this work the conductivity of doped and undoped amorphous-nanocrystalline silicon thin films is studied as a function of film thickness: a giant anisotropy of conductivity is established. The longitudinal conductivity decreases dramatically (by a factor of 109 − 1010) as the layer thickness is reduced from 1500 Å to 200 Å, while the transverse conductivity remains close to that of a doped a- Si:H. The data obtained are interpreted in terms of the percolation theory.

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