Simulation of a machine vision system for reflective surface defect inspection based on ray tracing

2020 ◽  
Vol 59 (8) ◽  
pp. 2656
Author(s):  
Pengfei Zhang ◽  
Pin Cao ◽  
Yongying Yang ◽  
Pan Guo ◽  
Shiwei Chen ◽  
...  
Author(s):  
Ashok Kumar Patel ◽  
Venkata Naresh Mandhala ◽  
Dinesh Kumar Anguraj ◽  
Soumya Ranjan Nayak

Fast track article for IS&T International Symposium on Electronic Imaging 2020: Stereoscopic Displays and Applications proceedings.


2005 ◽  
Vol 56 (8-9) ◽  
pp. 831-842 ◽  
Author(s):  
Monica Carfagni ◽  
Rocco Furferi ◽  
Lapo Governi

2012 ◽  
Vol 546-547 ◽  
pp. 1382-1386
Author(s):  
Yin Xia Liu ◽  
Ping Zhou

In order to promote the application and development of machine vision, The paper introduces the components of a machine vision system、common lighting technique and machine vision process. And the key technical problems are also briefly discussed in the application. A reference idea for application program of testing the quality of the machine parts is offered.


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