Phase information extraction for moiré fringes based on multiresolution analysis

2020 ◽  
Vol 59 (12) ◽  
pp. 3543
Author(s):  
Yun-yun Chen ◽  
Meng Xu ◽  
Wei-hao Cheng ◽  
Fang Gu
Author(s):  
F. J. Fraikor ◽  
A. W. Brewer

A number of investigators have examined moire patterns on precipitate particles in various age-hardening alloys. For example, Phillips has analyzed moire fringes at cobalt precipitates in copper and Von Heimendahl has reported on moire fringes in the system Al-Au. Recently, we have observed moire patterns on impurity precipitates in beryllium quenched in brine from 1000°C and aged at various temperatures in the range of 500-800°C. This heat treatment of beryllium rolled from vacuum cast ingots produces the precipitation of both an fee ternary phase, AlFeBe4, and an hcp binary phase, FeBe11. However, unlike a typical age-hardening alloy, the solute content of this material is low (less than 1000 ppm of Fe and 600 ppm of Al) and hence the total volume fraction of precipitates is small. Therefore there is some difficulty in distinguishing the precipitates and their orientation relationships with the beryllium matrix since the weak precipitate spots generally do not appear on the diffraction patterns.


Author(s):  
A. K. Datye ◽  
D. S. Kalakkad ◽  
L. F. Allard ◽  
E. Völkl

The active phase in heterogeneous catalysts consists of nanometer-sized metal or oxide particles dispersed within the tortuous pore structure of a high surface area matrix. Such catalysts are extensively used for controlling emissions from automobile exhausts or in industrial processes such as the refining of crude oil to produce gasoline. The morphology of these nano-particles is of great interest to catalytic chemists since it affects the activity and selectivity for a class of reactions known as structure-sensitive reactions. In this paper, we describe some of the challenges in the study of heterogeneous catalysts, and provide examples of how electron holography can help in extracting details of particle structure and morphology on an atomic scale.Conventional high-resolution TEM imaging methods permit the image intensity to be recorded, but the phase information in the complex image wave is lost. However, it is the phase information which is sensitive at the atomic scale to changes in specimen thickness and composition, and thus analysis of the phase image can yield important information on morphological details at the nanometer level.


Sign in / Sign up

Export Citation Format

Share Document