Metrology and modeling of microchannel plate x-ray optics

1997 ◽  
Vol 36 (22) ◽  
pp. 5461 ◽  
Author(s):  
A. N. Brunton ◽  
G. W. Fraser ◽  
J. E. Lees ◽  
I. C. E. Turcu
Keyword(s):  
Microchannel Plate ◽  
Ray Optics ◽  
X Ray

Development of microchannel plate (MCP) x-ray optics

1994 ◽  
Author(s):  
George W. Fraser ◽  
Adam N. Brunton ◽  
John E. Lees ◽  
James F. Pearson ◽  
Richard Willingale ◽  
...  
Keyword(s):  
Microchannel Plate ◽  
Ray Optics ◽  
X Ray

scholarly journals High-resolution micropore x-ray optics produced with microchannel plate technology

2001 ◽  
Author(s):  
Marco W. Beijersbergen ◽  
Marcos Bavdaz ◽  
Anthony J. Peacock ◽  
Enrico Tomaselli ◽  
R. Fairbend ◽  
...  
Keyword(s):  
High Resolution ◽  
Microchannel Plate ◽  
Ray Optics ◽  
X Ray

scholarly journals Microchannel-plate-based x-ray optics

1999 ◽  
Author(s):  
Marco W. Beijersbergen ◽  
Marcos Bavdaz ◽  
Anthony J. Peacock ◽  
Enrico Tomaselli ◽  
G. Fraser ◽  
...  
Keyword(s):  
Microchannel Plate ◽  
Ray Optics ◽  
X Ray

Microchannel plate x-ray optics on the Mercury imaging x-ray spectrometer

2018 ◽  
Author(s):  
James F. Pearson ◽  
Adrian Martindale ◽  
Charlotte H. Feldman ◽  
Gillian I. Butcher ◽  
Richard Willingale ◽  
...  
Keyword(s):  
Microchannel Plate ◽  
Ray Optics ◽  
X Ray

Metrology and modeling of microchannel plate X-ray optics

1999 ◽  
Vol 21 (2) ◽  
pp. 201
Author(s):  
A.N. Brunton ◽  
G.W. Fraser ◽  
J.E. Lees ◽  
I.C.E. Turcu
Keyword(s):  
Microchannel Plate ◽  
Ray Optics ◽  
X Ray

scholarly journals Novel micropore x-ray optics produced with microchannel plate technology

2000 ◽  
Author(s):  
Marco W. Beijersbergen ◽  
Marcos Bavdaz ◽  
Anthony J. Peacock ◽  
Enrico Tomaselli ◽  
George W. Fraser ◽  
...  
Keyword(s):  
Microchannel Plate ◽  
Ray Optics ◽  
X Ray

Inner wall roughness of microchannel-plate-based x-ray optics in etching process

2019 ◽  
Author(s):  
Jiao Lian ◽  
Xian Zhang ◽  
Yong Sun ◽  
Tiezhu Bo ◽  
Xiaoxuan Shi ◽  
...  
Keyword(s):  
Microchannel Plate ◽  
Etching Process ◽  
Wall Roughness ◽  
Ray Optics ◽  
X Ray

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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