High resolution particle sizing using the combination of time-of-flight and light-scattering measurements

1986 ◽  
Vol 25 (23) ◽  
pp. 4396 ◽  
Author(s):  
H. W. Schrader ◽  
W. G. Eisert
Keyword(s):  
Light Scattering ◽  
High Resolution ◽  
Time Of Flight ◽  
Particle Sizing ◽  
Scattering Measurements

Scattering Rings in Birefringent Porous Silicon

2003 ◽  
Vol 762 ◽  
Author(s):  
Claudio J. Oton ◽  
Zeno Gaburro ◽  
Mher Ghulinyan ◽  
Nicola Daldosso ◽  
Lucio Pancheri ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Light Scattering ◽  
Porous Silicon ◽  
Direct Measurement ◽  
Optical Anisotropy ◽  
Oblique Incidence ◽  
Laser Light ◽  
Anisotropic Scattering ◽  
Scattering Measurements

AbstractWe report the observation of strongly anisotropic scattering of laser light at oblique incidence on (100)-oriented porous silicon layers. We performed angle-resolved light scattering measurements and three concentric rings were observed. Modeling porous silicon by means of nanometric columnar air pores and an effective anisotropic uniaxial dielectric constant explains the observed phenomenon, and besides, the observation of the angle aperture of these rings allows a direct measurement of relative birefringence. We finally study the changes of optical anisotropy after different modifications of the structure.

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