A Balanced Optical System for Excess Noise Factor Measurement of Avalanche Photodiode

2016 ◽  
Author(s):  
Ke Wen ◽  
Junjie Tu ◽  
Yanli Zhao
Keyword(s):  
Optical System ◽  
Avalanche Photodiode ◽  
Noise Factor ◽  
Excess Noise ◽  
Excess Noise Factor ◽  
Factor Measurement

AlGaSb avalanche photodiode exhibiting a very low excess noise factor

1989 ◽  
Vol 54 (24) ◽  
pp. 2422-2423 ◽  
Author(s):  
S. Miura ◽  
T. Mikawa ◽  
H. Kuwatsuka ◽  
N. Yasuoka ◽  
T. Tanahashi ◽  
...  
Keyword(s):  
Avalanche Photodiode ◽  
Noise Factor ◽  
Excess Noise ◽  
Excess Noise Factor

scholarly journals Modeling the e-APD SAPHIRA/C-RED ONE camera at low flux level

2019 ◽  
Vol 625 ◽  
pp. A38
Author(s):  
C. Lanthermann ◽  
N. Anugu ◽  
J.-B. Le Bouquin ◽  
J. D. Monnier ◽  
S. Kraus ◽  
...  
Keyword(s):  
Near Infrared ◽  
Avalanche Photodiode ◽  
Noise Factor ◽  
Excess Noise ◽  
Excess Noise Factor ◽  
Total Transmission ◽  
Avalanche Gain ◽  
Flux Level ◽  
Readout Noise ◽  
Infrared Interferometry

Context. We implement an electron avalanche photodiode (e-APD) in the MIRC-X instrument, which is an upgrade of the six-telescope near-infrared imager MIRC, at the CHARA array. This technology should improve the sensitivity of near-infrared interferometry. Aims. We aim to characterize a near-infrared C-RED ONE camera from First Light Imaging (FLI) using an e-APD from Leonardo (previously SELEX). Methods. We first used the classical mean-variance analysis to measure the system gain and the amplification gain. We then developed a physical model of the statistical distribution of the camera output signal. This model is based on multiple convolutions of the Poisson statistic, the intrinsic avalanche gain distribution, and the observed distribution of the background signal. At low flux level, this model independently constrains the incident illumination level, the total gain, and the excess noise factor of the amplification. Results. We measure a total transmission of 48 ± 3% including the cold filter and the Quantum Efficiency. We measure a system gain of 0.49 ADU/e, a readout noise of 10 ADU, and amplification gains as high as 200. These results are consistent between the two methods and therefore validate our modeling approach. The measured excess noise factor based on the modeling is 1.47 ± 0.03, with no obvious dependency with flux level or amplification gain. Conclusions. The presented model allows the characteristics of the e-APD array to be measured at low flux level independently of a preexisting calibration. With < 0.3 electron equivalent readout noise at kilohertz frame rates, we confirm the revolutionary performances of the camera with respect to the PICNIC or HAWAII technologies. However, the measured excess noise factor is significantly higher than what is claimed in the literature (< 1.25), and explains why counting multiple photons remains challenging with this camera.

An AlGaSb avalanche photodiode exhibiting low excess noise factor

2003 ◽  
Author(s):  
T. Mikawa ◽  
S. Miura ◽  
H. Kuwatsuka ◽  
N. Yasuoka ◽  
T. Tanahashi ◽  
...  
Keyword(s):  
Avalanche Photodiode ◽  
Noise Factor ◽  
Excess Noise ◽  
Excess Noise Factor

A resonant-cavity, separate-absorption-and-multiplication, avalanche photodiode with low excess noise factor

1996 ◽  
Vol 17 (3) ◽  
pp. 91-93 ◽  
Author(s):  
K.A. Anselm ◽  
S.S. Murtaza ◽  
C. Hu ◽  
H. Nie ◽  
B.G. Streetman ◽  
...  
Keyword(s):  
Resonant Cavity ◽  
Avalanche Photodiode ◽  
Noise Factor ◽  
Excess Noise ◽  
Excess Noise Factor

EMPIRICAL FORMULAE FOR EXCESS NOISE FACTOR WITH DEAD SPACE FOR SINGLE CARRIER MULTIPLICATION

2011 ◽  
Vol 10 (03) ◽  
pp. 315-321
Author(s):  
AHMAD H. DEHWAH ◽  
IDRIS A. AJIA ◽  
JOHN S. MARSLAND
Keyword(s):  
Dead Space ◽  
Avalanche Photodiode ◽  
Noise Factor ◽  
Excess Noise ◽  
Excess Noise Factor ◽  
Single Carrier ◽  
Carrier Multiplication ◽  
Space Effect ◽  
The Dead ◽  
Deterministic Limit

In this letter, two empirical equations are presented for the calculation of the excess noise factor of an avalanche photodiode for single carrier multiplication including the dead space effect. The first is an equation for calculating the excess noise factor when the multiplication approaches infinity as a function of parameters that describe the degree of the dead space effect. The second equation can be used to find the minimum value of the excess noise factor for any multiplication when the dead space effect is completely dominant, the so called "deterministic" limit. This agrees with the theoretically known equation for multiplications less than or equal to two.

Modeling a novel InP/InGaAs avalanche photodiode structure: Reducing the excess noise factor

2019 ◽  
Vol 435 ◽  
pp. 374-377 ◽  
Author(s):  
Guipeng Liu ◽  
Xin Wang ◽  
Jingze Zhao ◽  
Wenjie Chen ◽  
Yonghui Tian ◽  
...  
Keyword(s):  
Avalanche Photodiode ◽  
Noise Factor ◽  
Excess Noise ◽  
Excess Noise Factor

Simulation Analysis of Excess Noise Factors for Photomultiplier Tube

2014 ◽  
Vol 556-562 ◽  
pp. 1745-1748
Author(s):  
Shen Wang ◽  
Zhao Yang Zeng ◽  
Fei Zhang
Keyword(s):  
Numerical Simulations ◽  
Simulation Analysis ◽  
Photomultiplier Tube ◽  
Noise Factor ◽  
Excess Noise ◽  
Excess Noise Factor ◽  
Photoelectric Detector ◽  
Changing Trend ◽  
Noise Factors

Noise is one of the most significant indicators to measure the performance of the PMT, which is regarded as a photoelectric detector. Moreover, the excess noise factor F is an important parameter to describe the noise. Excess noise factor expressions for PMT in different situations are derived and analyzed by simulation in this paper. Some numerical simulations are made to obtain the maximum and minimum excess noise factor F and the changing trend of F with each parameter. From the analysis, we can minimize the noise for PMT to increase the detection precision as a photoelectric detector.

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