Atomic force microscopy observation on nuclear reassembly in a cell-free system

Ning YANG

doi:10.1360/03ww0086

Atomic force microscopy observation on nuclear reassembly in a cell-free system

Chinese Science Bulletin ◽

10.1360/03ww0086 ◽

2003 ◽

Vol 48 (21) ◽

pp. 2284

Author(s):

Ning YANG

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Observation ◽

Free System ◽

Cell Free System ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Observation ◽

A Cell

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Atomic force microscopy observation of the enamel roughness and depth profile after phosphoric acid etching

Journal of Electron Microscopy ◽

10.1093/jmicro/dfp042 ◽

2009 ◽

Vol 59 (2) ◽

pp. 119-125 ◽

Cited By ~ 16

Author(s):

J. P. Loyola-Rodriguez ◽

V. Zavala-Alonso ◽

E. Reyes-Vela ◽

N. Patino-Marin ◽

F. Ruiz ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Phosphoric Acid ◽

Depth Profile ◽

Acid Etching ◽

Microscopy Observation ◽

Force Microscopy ◽

Atomic Force ◽

Enamel Roughness ◽

Atomic Force Microscopy Observation ◽

Phosphoric Acid Etching

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In situ atomic force microscopy observation of hydrogen absorption/desorption by Palladium thin film

Applied Surface Science ◽

10.1016/j.apsusc.2011.09.103 ◽

2011 ◽

Vol 258 (4) ◽

pp. 1456-1459 ◽

Cited By ~ 4

Author(s):

Itoko Matsumoto ◽

Kouji Sakaki ◽

Yumiko Nakamura ◽

Etsuo Akiba

Keyword(s):

Thin Film ◽

Atomic Force Microscopy ◽

Hydrogen Absorption ◽

Microscopy Observation ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Observation

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Atomic Force Microscopy Observation of the Initial Growth Stage and the Ferroelectric Properties ofBi2VO5.5Films onSrTiO3(100), Si(100) Substrates

Japanese Journal of Applied Physics ◽

10.1143/jjap.36.5917 ◽

1997 ◽

Vol 36 (Part 1, No. 9B) ◽

pp. 5917-5920 ◽

Cited By ~ 6

Author(s):

Takeshi Yanagita ◽

Hitoshi Tabata ◽

Tomoji Kawai

Keyword(s):

Atomic Force Microscopy ◽

Growth Stage ◽

Ferroelectric Properties ◽

Initial Growth ◽

Microscopy Observation ◽

Force Microscopy ◽

Initial Growth Stage ◽

Atomic Force ◽

Atomic Force Microscopy Observation

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Self-assembly of 50 bp poly(dA)·poly(dT) DNA on highly oriented pyrolytic graphite via atomic force microscopy observation and molecular dynamics simulation

The Journal of Chemical Physics ◽

10.1063/1.4818595 ◽

2013 ◽

Vol 139 (8) ◽

pp. 085102 ◽

Cited By ~ 9

Author(s):

Kentaro Doi ◽

Hiroshi Takeuchi ◽

Ryosuke Nii ◽

Shingo Akamatsu ◽

Toshiya Kakizaki ◽

...

Keyword(s):

Molecular Dynamics ◽

Atomic Force Microscopy ◽

Molecular Dynamics Simulation ◽

Self Assembly ◽

Pyrolytic Graphite ◽

Dynamics Simulation ◽

Microscopy Observation ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Observation

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In situ atomic force microscopy observation of lithium deposition at an elevated temperature

Journal of Power Sources ◽

10.1016/s0378-7753(01)00511-0 ◽

2001 ◽

Vol 97-98 ◽

pp. 265-268 ◽

Cited By ~ 14

Author(s):

Ryo Mogi ◽

Minoru Inaba ◽

Takeshi Abe ◽

Zempachi Ogumi

Keyword(s):

Atomic Force Microscopy ◽

Elevated Temperature ◽

Microscopy Observation ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Observation ◽

Lithium Deposition

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An Atomic Force Microscopy Observation of Poly(Vinylidene Fluoride) Banded Spherulites

Journal of Macromolecular Science Part B ◽

10.1081/mb-120021604 ◽

2003 ◽

Vol 42 (3-4) ◽

pp. 753-760 ◽

Cited By ~ 17

Author(s):

Akihiko Toda ◽

Takeshi Arita ◽

Masamichi Hikosaka ◽

Jamie K. Hobbs ◽

Mervyn J. Miles

Keyword(s):

Atomic Force Microscopy ◽

Vinylidene Fluoride ◽

Microscopy Observation ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Observation ◽

Poly Vinylidene Fluoride ◽

Banded Spherulites

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Atomic force microscopy observation of insulated molecular wire formed by conducting polymer and molecular nanotube

The Journal of Chemical Physics ◽

10.1063/1.1446423 ◽

2002 ◽

Vol 116 (5) ◽

pp. 1753-1756 ◽

Cited By ~ 81

Author(s):

Takeshi Shimomura ◽

Tomonori Akai ◽

Takumi Abe ◽

Kohzo Ito

Keyword(s):

Atomic Force Microscopy ◽

Conducting Polymer ◽

Molecular Wire ◽

Microscopy Observation ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Observation

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Tapping mode atomic force microscopy observation of self-affine fractal roughness in electrochemically roughened silver electrode surfaces

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.588419 ◽

1996 ◽

Vol 14 (2) ◽

pp. 1153 ◽

Cited By ~ 14

Author(s):

I. Otsuka

Keyword(s):

Atomic Force Microscopy ◽

Silver Electrode ◽

Microscopy Observation ◽

Tapping Mode ◽

Force Microscopy ◽

Electrode Surfaces ◽

Atomic Force ◽

Atomic Force Microscopy Observation ◽

Fractal Roughness ◽

Mode Atomic Force Microscopy

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Atomic force microscopy observation of enamel surfaces treated with selfetching primer

Dental Materials Journal ◽

10.4012/dmj.2012-227 ◽

2013 ◽

Vol 32 (1) ◽

pp. 181-188 ◽

Cited By ~ 11

Author(s):

Yusuke HASHIMOTO ◽

Yoshiya HASHIMOTO ◽

Aki NISHIURA ◽

Naoyuki MATSUMOTO

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Observation ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Observation

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Non-contact atomic force microscopy observation of 5-(4-methylthiophenyl)-10,15,20-tris(3,5-di-t-butylphenyl)porphyrin molecules deposited on Au(111) surface

Thin Solid Films ◽

10.1016/s0040-6090(03)00758-2 ◽

2003 ◽

Vol 438-439 ◽

pp. 56-60 ◽

Cited By ~ 11

Author(s):

Shukichi Tanaka ◽

Hitoshi Suzuki ◽

Toshiya Kamikado ◽

Shinro Mashiko

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Observation ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Observation

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