Escape Peaks in X-Ray Diffractometry*

1964 ◽  
Vol 8 ◽  
pp. 118-133 ◽  
Author(s):  
William Parrish
Keyword(s):  
Absorption Edge ◽  
Pulse Height ◽  
Pulse Amplitude ◽  
Silicon Powder ◽  
X Rays ◽  
Pulse Height Analyzer ◽  
Escape Peak ◽  
X Ray ◽  
Absorption Edge Energy ◽  
Detector Element

AbstractEscape peaks occur when the incident X-ray quantum, energy exceeds the absorption edge energy of the detector element and the resulting X-ray fluorescence is lost from the detector. The most common escape peaks result from 1 K-fluorescence in NaI-scintillation counters and Xe K-, Xe L-, and Kr K-fluorescence in proportional counters. The average pulse amplitude of the escape peak is proportional to the difference of the Energies of the incident and fluorescent X-rays. If the intensity of the escape peak is high as in the case of Mo Kα and a kryptoopreportional counter, and the lower level of the pulse height analyzer is raised to reject the escape peak, the quantum counting efficiency may be reduced by a factor of two. When the pulse height analyzer is set for characteristic incident radiation, escape peaks appear in powder patterns at small diffraction angles. These broad low-intensity peaks are often mistakenly identified as resulting from misalignment, scattering, etc. Each powder reflection can produce its own escape peak which occurs at an angle slightly smaller than the absorption edge of the detector element. In a silicon powder pattern the three strongest reflections produce three resolved escape peaks whose peak intensities are about 4% of their corresponding Cu Kα peaks when the X-ray tube is operated at 50 kV. The escape peak intensities decrease with decreasing X-ray tube voltage and disappear when the voltage is lower than the absorption edge energy of the detector element. Absorption edge peaks observed without the upper level of the pulse height analyzer are similar in appearance, intensity, and diffraction angle to the escape peaks. In complex powder patterns the escape peak pattern is unresolved and may produce a number of very broad peaks.

Monte-Carlo calculations of Ge detector escape-peak efficiencies

1991 ◽  
Vol 38 (2) ◽  
pp. 221-225 ◽  
Author(s):  
A. Owens ◽  
N. Gehrels ◽  
S.M. Pascarelle ◽  
B.J. Teegarden
Keyword(s):  
Monte Carlo ◽  
Escape Peak ◽  
Monte Carlo Calculations ◽  
Ge Detector

SPECTRUM ANALYSIS TAKING ACCOUNT OF THE TAIL, ESCAPE FUNCTIONS AND SUB-LINES (SAPIX version 4)

2000 ◽  
Vol 10 (03n04) ◽  
pp. 101-114 ◽  
Author(s):  
K. SERA ◽  
S. FUTATSUGAWA
Keyword(s):  
Response Function ◽  
Spectrum Analysis ◽  
Peak Position ◽  
Main Peak ◽  
Small Shift ◽  
Escape Peak ◽  
X Ray ◽  
Peak Separation ◽  
Small Peak ◽  
Tail Function

A new x-ray-spectrum-analysis program, which is capable of fitting with response functions including a tail function, an escape peak and sub-lines, has been developed. In this code, the tail function is expressed by combination of two or three Gaussian functions. A tail function, an escape and sub- or satellite-lines are regarded as functions belonging to the main peak and are included in it. A small shift of peak position depending on measuring conditions can be easily corrected in the program. As a result of fitting to practical spectra with the response function thus prepared, it becomes possible to draw a smooth background over a wide x-ray-energy range and to analyze a whole spectrum simultaneously. Thus, accuracy and reproducibility of a spectrum analysis are much improved. By means of this code, correct values of peak yield of Co - K α, which overlaps with the tail of Fe - K β and is quite difficult to be accurately separated by fitting with Gaussians, have been obtained. Furthermore, accuracy of peak separation of a small peak, which overlaps with the escape peak belonging to a huge peak, has been improved. Accuracy of quantitative analysis for high-Z elements by means of Kβ yields has also been improved by using the response function including sub-lines, and it became possible to accurately separate small Kα lines from Kβ lines of the other elements.

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