Package Defect and Material Integrity Failure Detection Using Dynamic Scanning Infrared Thermography (DSIRT)

2016 ◽  
Keyword(s):  
Infrared Thermography ◽  
Failure Detection ◽  
Dynamic Scanning

Dynamic Scanning Electron Microscopy of Small Particles

1975 ◽  
Vol 33 ◽  
pp. 280-281
Author(s):  
W. Krakow ◽  
W. C. Nixon
Keyword(s):  
Electron Microscopy ◽  
Low Noise ◽  
Time Sequence ◽  
Field Of View ◽  
Video Tape ◽  
Small Particles ◽  
Polystyrene Spheres ◽  
Field Distributions ◽  
Dynamic Scanning ◽  
Scanning Electron

The scanning electron microscope (SEM) can be run at television scanning rates and used with a video tape recorder to observe dynamic specimen changes. With a conventional tungsten source, a low noise TV image is obtained with a field of view sufficient to cover the area of the specimen to be recorded. Contrast and resolution considerations have been elucidated and many changing specimens have been studied at TV rates.To extend the work on measuring the magnitude of charge and field distributions of small particles in the SEM, we have investigated their motion and electrostatic interaction at TV rates. Fig. 1 shows a time sequence of polystyrene spheres on a conducting grating surface inclined to the microscope axis. In (la) there are four particles present in the field of view, while in (lb) a fifth particle has moved into view.

Measuring Facial Skin Temperature Changes Caused by Mental Work-Load with Infrared Thermography

2016 ◽  
Vol 136 (11) ◽  
pp. 1581-1585 ◽  
Author(s):  
Tota Mizuno ◽  
Takeru Sakai ◽  
Shunsuke Kawazura ◽  
Hirotoshi Asano ◽  
Kota Akehi ◽  
...  
Keyword(s):  
Skin Temperature ◽  
Infrared Thermography ◽  
Work Load ◽  
Facial Skin ◽  
Mental Work ◽  
Temperature Changes ◽  
Mental Work Load
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