Multiple-Frequency Electric Fields for Measuring Moisture Content of Cured Burley Tobacco

1985 ◽  
Vol 28 (3) ◽  
pp. 915-921
Author(s):  
W. T. Nickell ◽  
W. H. Henson ◽  
Jr.
Keyword(s):  
Moisture Content ◽  
Electric Fields ◽  
Multiple Frequency ◽  
Burley Tobacco

scholarly journals Thermal and dielectric properties of pine wood in the transverse direction

BioResources ◽  
2009 ◽  
Vol 4 (4) ◽  
pp. 1663-1669 ◽  
Keyword(s):  
Thermal Conductivity ◽  
Dielectric Properties ◽  
Moisture Content ◽  
Electric Fields ◽  
Room Temperature ◽  
Transverse Direction ◽  
Dielectric Parameters ◽  
Design Problems ◽  
Pine Wood ◽  
Moisture Conditions

In this paper, the thermal conductivity and dielectric parameters for pine [Pinus sylvestris (L.)] woods were determined in transverse directions for moisture conditions from oven-dry to 22 percent at a room temperature of 22 to 24 °C. Results indicate that the behaviors of thermal conductivity and dielectric parameters with moisture content and structural directions were similar. In general, the properties increased within the range studied with increasing moisture content. The radial values were similar to tangential values for both thermal conductivity and dielectric properties. The data presented here should be useful in most design problems where pine wood is subjected to microwave electric fields and heat changes.

The Relation of Leaf Moisture Content and Certain Chemical Changes During Curing of Burley Tobacco

1972 ◽  
Vol 15 (2) ◽  
pp. 0342-0345
Author(s):  
W. H. Henson ◽  
Jr. ◽  
L. R. Walton and J. M. Bunn
Keyword(s):  
Moisture Content ◽  
Chemical Changes ◽  
Burley Tobacco

scholarly journals Depolarizing Chipless Tags with Polarization Insensitive Capabilities

Electronics ◽  
2021 ◽  
Vol 10 (4) ◽  
pp. 478
Author(s):  
Michele Borgese ◽  
Filippo Costa ◽  
Simone Genovesi ◽  
Giuliano Manara
Keyword(s):  
Electric Field ◽  
Electric Fields ◽  
Ground Plane ◽  
Angular Frequency ◽  
Polarization Conversion ◽  
Relative Rotation ◽  
Multiple Frequency ◽  
Frequency Shifts ◽  
Single Dipole ◽  
Polarization Insensitive

A novel depolarizing chipless tag configuration with high angular insensitivity is presented. The basic tag comprises two dipole resonators arranged with a relative rotation of 45°. The proposed configuration improves the depolarization properties performance of a single dipole over the ground plane which provides a peak with perfect polarization conversion only if the electric field impinges at 45° with respect to the dipole resonator. The second dipole arranged at 45° compensates the cross-polar reduction which is observed when the electric field is not correctly polarized. Indeed, when the field is tilted by 90° with respect to the first dipole, it forms an angle of 45° with the second one. The proposed configuration is also analyzed for providing multiple frequency peaks. A tag with 4 angular independent frequency peaks laying between 2 GHz and 5.5 GHz is designed. Angular frequency maps are used to illustrate the peculiar frequency shifts achieved when the electric fields rotate in the plane of the dipole. Finally, a prototype of the polarization insensitive tags is fabricated and measured to confirm the simulated results.

Control of Metal Alloy Oxidation with Electric Fields

1973 ◽  
Vol 31 ◽  
pp. 164-165
Author(s):  
R. R. Dils ◽  
P. S. Follansbee
Keyword(s):  
Electric Fields ◽  
Oxidation Process ◽  
Base Alloy ◽  
Oxide Surface ◽  
Platinum Electrodes ◽  
Insulating Layer ◽  
Iron Base Alloy ◽  
Alloy Oxidation ◽  
Aluminum Oxide Layer ◽  
And Control

Electric fields have been applied across oxides growing on a high temperature alloy and control of the oxidation of the material has been demonstrated. At present, three-fold increases in the oxidation rate have been measured in accelerating fields and the oxidation process has been completely stopped in a retarding field.The experiments have been conducted with an iron-base alloy, Pe 25Cr 5A1 0.1Y, although, in principle, any alloy capable of forming an adherent aluminum oxide layer during oxidation can be used. A specimen is polished and oxidized to produce a thin, uniform insulating layer on one surface. Three platinum electrodes are sputtered on the oxide surface and the specimen is reoxidized.

Electron-Mirror Microscopic Aspects of Ferroelectric Domains of BaTiO3 And Ca2Sr (C2H5CO2)6

1970 ◽  
Vol 28 ◽  
pp. 478-479
Author(s):  
Teruo Someya ◽  
Jinzo Kobayashi
Keyword(s):  
Surface Layer ◽  
Electric Fields ◽  
Quantitative Study ◽  
Recent Progress ◽  
Ferroelectric Domain ◽  
Resolving Power ◽  
Surface Pattern ◽  
Crystal Surfaces ◽  
One Dimensional ◽  
Ferroelectric Domains

Recent progress in the electron-mirror microscopy (EMM), e.g., an improvement of its resolving power together with an increase of the magnification makes it useful for investigating the ferroelectric domain physics. English has recently observed the domain texture in the surface layer of BaTiO3. The present authors ) have developed a theory by which one can evaluate small one-dimensional electric fields and/or topographic step heights in the crystal surfaces from their EMM pictures. This theory was applied to a quantitative study of the surface pattern of BaTiO3).

Electron Microscope Observations of Magnetic and Electric Effects

1970 ◽  
Vol 28 ◽  
pp. 430-431
Author(s):  
John Silcox
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Magnetic Image ◽  
Magnetic Effects ◽  
Ferromagnetic Films ◽  
Diffraction Contrast ◽  
Microscope Images ◽  
Electric Effects ◽  
Image Detail

Several aspects of magnetic and electric effects in electron microscope images are of interest and will be discussed here. Clearly electrons are deflected by magnetic and electric fields and can give rise to image detail. We will review situations in ferromagnetic films in which magnetic image effects are the predominant ones, others in which the magnetic effects give rise to rather subtle changes in diffraction contrast, cases of contrast at specimen edges due to leakage fields in both ferromagnets and superconductors and some effects due to electric fields in insulators.

Electron microscopy studies of PZT ferroelectric film capacitor structures

1992 ◽  
Vol 50 (2) ◽  
pp. 1364-1365
Author(s):  
V. Kaushik ◽  
P. Maniar ◽  
J. Olowolafe ◽  
R. Jones ◽  
A. Campbell ◽  
...  
Keyword(s):  
Electric Fields ◽  
Sol Gel ◽  
Ferroelectric Material ◽  
Dielectric Constants ◽  
Dielectric Films ◽  
Lead Zirconium Titanate ◽  
Si Substrate ◽  
Film Capacitor ◽  
Pzt Films ◽  
High Dielectric

Lead zirconium titanate films (Pb (Zr,Ti) O3 or PZT) are being considered for potential application as dielectric films in memory technology due to their high dielectric constants. PZT is a ferroelectric material which shows spontaneous polarizability, reversible under applied electric fields. We report herein some results of TEM studies on thin film capacitor structures containing PZT films with platinum-titanium electrodes.The wafers had a stacked structure consisting of PZT/Pt/Ti/SiO2/Si substrate as shown in Figure 1. Platinum acts as electrode material and titanium is used to overcome the problem of platinum adhesion to the oxide layer. The PZT (0/20/80) films were deposited using a sol-gel method and the structure was annealed at 650°C and 800°C for 30 min in an oxygen ambient. XTEM imaging was done at 200KV with the electron beam parallel to <110> zone axis of silicon.Figure 2 shows the PZT and Pt layers only, since the structure had a tendency to peel off at the Ti-Pt interface during TEM sample preparation.

Current Status of Solid-State X-Ray Systems

1985 ◽  
Vol 43 ◽  
pp. 158-161
Author(s):  
Martin Peckerar ◽  
Anastasios Tousimis
Keyword(s):  
Solid State ◽  
Electric Fields ◽  
Spectral Lines ◽  
Current Status ◽  
Mobile Charge ◽  
Electron Hole ◽  
X Ray ◽  
Sensing Systems ◽  
Transmission Electron ◽  
Electron Microscopes

Solid state x-ray sensing systems have been used for many years in conjunction with scanning and transmission electron microscopes. Such systems conveniently provide users with elemental area maps and quantitative chemical analyses of samples. Improvements on these tools are currently sought in the following areas: sensitivity at longer and shorter x-ray wavelengths and minimization of noise-broadening of spectral lines. In this paper, we review basic limitations and recent advances in each of these areas. Throughout the review, we emphasize the systems nature of the problem. That is. limitations exist not only in the sensor elements but also in the preamplifier/amplifier chain and in the interfaces between these components.Solid state x-ray sensors usually function by way of incident photons creating electron-hole pairs in semiconductor material. This radiation-produced mobile charge is swept into external circuitry by electric fields in the semiconductor bulk.

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