scholarly journals Spray Pyrolysis Technique for the deposition of Lead Oxide (PbO) Thin Films; its Electrochemical behaviour and Structural and optical Properties

2018 ◽  
Vol 15 (2) ◽  
pp. 134-140
Author(s):  
Anil B Gite ◽  
G. E. Patil ◽  
G. H. Jain

Thin film of Lead oxide (PbO) was prepared by spray pyrolysis technique on glass substrate at 250°C. The cyclic voltammetry measurement was carried out to study the oxidation reduction reactions of non-aqueous lead ions at various molar concentrations which is from 0.01M to 0.09M. Elecrochemical studies were carried out with Ag/AgCl as a reference electrode , Pt as working electrode while platinum mesh as counter electrode.Lead oxide appears to be poisonous yellow or reddish yellow solid. Structural characterization of films was analyze with X- ray diffraction (XRD) and optical band gap was determined by UV-Vis Spectroscopy.

2013 ◽  
Vol 313-314 ◽  
pp. 164-168 ◽  
Author(s):  
M.H. Abdi ◽  
N.B. Ibrahim ◽  
M.M. Bagheree Mohagheghee

Emergenceof innovative technological deposition technique of spray pyrolysis enabled the enhancement of structural, optical, and electrical properties of Sn1-xCrxO2 (x=0.0, 0.02, 0.04, 0.06, 0.10, 0.15) transparent semiconductors thin films in the present study. To evaluate these properties, X-Ray diffraction (XRD) spectroscopy were usedto study the elemental component and the crystalline nature of the materials while the optical properties and structure of the samples were evaluated using UV—vis spectroscopy and field emission scanning electron microscopy (FE-SEM).Finding showed that the Cr-doped SnO2 films were tetragonal in shape. Transmission spectra of the deposited films showed high transparency of ~ 70-90% in visible region with optical edge of 3.7eVfor SnO2. Resistivity of pure tin oxide samples was 0.01 Ω-Cm and increases with increase in dopant level. The Hall voltage showed that the type of semiconductor changed with increasing of dopant.


2014 ◽  
Vol 875-877 ◽  
pp. 49-53
Author(s):  
Lan Anh Luu Thi ◽  
Duc Hieu Nguyen ◽  
Mateus Manuel Neto ◽  
Ngoc Trung Nguyen ◽  
Thach Son Vo

Nanocrystalline titania (TiO2) thin films prepared by spray pyrolysis deposition on to the heated glass in a temperature range of TS = 350 ÷ 450oC. Analysis of optical transmission spectral of films reveals an optical band gap of about 3.2÷3.4 eV and the transmittance above 80% for TiO2 films with thickness of 0.8÷1.6 µm. X-ray diffraction (XRD) analysis demonstrates that the films are found of anatase phase in crystal structure. The AFM photographs show the nano-size of the constituents. The crystallize size and crystalline of the samples is discussed with respect to the film thickness and deposition temperature.


2018 ◽  
Vol 1 (2) ◽  
pp. 9-12
Author(s):  
S.P. Soundararajan ◽  
M Murugan ◽  
K Mohanraj ◽  
Babu Balraj ◽  
Tamiloli Devendhiran

In this work the copper oxide thin films have been coated using Jet nebulizer spray pyrolysis technique. The prepared CuO thin films were characterized by various techniques such as X-ray diffraction (XRD), Scanning Electron Microscope (SEM) and Energy dispersive X-ray spectroscopy (EDX) techniques, in order to study its crystalline nature, particle size and the band gap respectively.


2013 ◽  
Vol 745-746 ◽  
pp. 478-484 ◽  
Author(s):  
Feng Jiao Mei ◽  
Qing Cui Wan ◽  
An Ping ◽  
Hua Liao ◽  
Xue Qing Xu ◽  
...  

CuInS2quantum dots have been deposited onto mesoporous TiO2films on TCO glass substrate via successive ionic layer absorption and reaction process (SILAR) by using three different routes and post-deposition annealing in sulfur ambiance. The influence of the deposition sequence of the In-S and Cu-S on the microstructure of CuInS2sensitized TiO2electrodes and the photovoltaic performance of the solar cells have been investigated. The microstructure of CuInS2sensitized TiO2electrodes has been investigated by using X-ray diffraction (XRD), Raman spectra, scanning electron microscopy (SEM), and energy dispersive spectroscopy (EDS) analysis. The optical absorption property of the electrodes has been detected by using UV-Vis spectroscopy, and the photovoltaic performance of CuInS2quantum dots sensitized solar cells has been determined by cyclic voltammetry measurement. It has been found that when the Cu-S was deposited prior to In-S, the chalcopyrite phase CuInS2could not be observed due to the sublimation of InxS during the annealing under low pressure. A small amount of CuInS2has been detected when In-S and Cu-S was deposited alternately onto the TiO2films. However, chalcopyrite phase CuInS2can be obtained when In-S was deposited prior to Cu-S, and a relative high efficiency of ca. 0.92% (Voc= 0.35V, Jsc= 8.49 mA·cm-2, FF = 0.31) has been achieved via SILAR without KCN treatment and rapid thermal annealing.


2013 ◽  
Vol 1538 ◽  
pp. 115-121
Author(s):  
Sandip Das ◽  
Kelvin J. Zavalla ◽  
M. A. Mannan ◽  
Krishna C Mandal

ABSTRACTLarge-area Cu2ZnSnS4 (CZTS) thin films were deposited by low-cost spray pyrolysis technique on Mo-coated soda-lime glass (SLG) substrates at varied substrate temperatures of 563-703°K. Deposition conditions were optimized to obtain best quality films and effect of post deposition thermal processing of the as-deposited films under H2S ambient were investigated. Structural, morphological, and compositional characterization of as-deposited and H2S treated CZTS absorber layers were carried out by x-ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy (SEM) and energy dispersive x-ray analysis (EDX). Optical and electrical properties were measured by UV-Vis spectroscopy, van der Pauw, and Hall-effect measurements. Films grown at ∼360°C substrate temperature showed superior optoelectronic properties, improved stoichiometry and smoother morphology compared to films grown at much higher or lower temperatures. Film properties were significantly improved after the H2S processing. Our results show that large area high quality CZTS films can be fabricated by low-cost spray pyrolysis technique for high throughput commercial production of CZTS based heterojunction solar cells.


2018 ◽  
Vol 84 (3) ◽  
pp. 30301 ◽  
Author(s):  
Wided Zerguine ◽  
Djamila Abdi ◽  
Farid Habelhames ◽  
Meriem Lakhdari ◽  
Hassina Derbal-Habak ◽  
...  

Effect of the annealing oxidation time of electrodeposited lead (Pb) on the phase formation of lead oxide (PbO) films is reported. The phase structure, optical properties, size and morphology of the films were investigated by scanning electron microscopy, X-ray diffraction and UV-vis spectroscopy. The relationship between structur and photoelectrochemical properties was investigated. Thin films of PbO produced via air annealing of electrodeposited lead consist of a mixture of two phases, orthorhombic (o-PbO) and tetragonal (t-PbO), that determine the material properties and effectiveness as absorber layer in a photoelectrochemical device. The proportion of tetragonal t-PbO increases for longer heat treatments. After 40 h, the sample consists mainly of tetragonal t-PbO. The p-type semiconducting behavior of lead oxide was studied by photocurrent measurements. Different heat treatments yield variations in the ratio of tetragonal to orthorhombic lead oxide that effect on device performances, where devices with a higher content of tetragonal t-PbO show higher photocurrent than with the orthorhombic phase.


2012 ◽  
Vol 727-728 ◽  
pp. 691-696 ◽  
Author(s):  
Tiago Falcade ◽  
Giselle Barbosa de Oliveira ◽  
Diego Pereira Tarragó ◽  
Vânia Caldas de Sousa ◽  
Célia de Fraga Malfatti

Many studies have been reported in the literature related to YSZ films deposited on dense substrate or applied directly on the SOFC anode. However, there are not a lot of studies about the YSZ deposition on the cathode. The present work aims to obtain yttria-stabilized zirconia (YSZ), using the spray pyrolysis technique, for their application as electrolyte in solid oxide fuel cells (SOFC). The films were obtained from a precursor solution containing zirconium and yttrium salts, dissolved in ethanol and propylene glycol (1:1), this solution was sprayed onto a heated LSM porous substrate. The substrate temperature was varied in order to obtain dense and homogeneous films. After deposition, the films were heat treated, aiming to crystallize and stabilize the zirconia cubic phase. The films were characterized by Scanning Electron Microscopy (SEM), thermal analysis, X-ray diffraction and Fourier transform Infrared Spectroscopy (FT-IR).


2014 ◽  
Vol 2014 ◽  
pp. 1-4 ◽  
Author(s):  
K. R. Nemade ◽  
S. A. Waghuley

Solvent mixed spray pyrolysis technique has attracted a global interest in the synthesis of nanomaterials since reactions can be run in liquid state without further heating. Magnesium oxide (MgO) is a category of the practical semiconductor metal oxides, which is extensively used as catalyst and optical material. In the present study, MgO nanoparticles were successfully synthesized using a solvent mixed spray pyrolysis. The X-ray diffraction pattern confirmed the formation of MgO phase with an excellent crystalline structure. Debye-Scherrer equation is used for the determination of particle size, which was found to be 9.2 nm. Tunneling electron microscope analysis indicated that the as-synthesized particles are nanoparticles with an average particle size of 9 nm. Meanwhile, the ultraviolet-visible spectroscopy of the resulting product was evaluated to study its optical property via measurement of the band gap energy value.


Author(s):  
Sofea Nabila Hazmin ◽  
F. S. S. Zahid ◽  
N. S. M. Sauki ◽  
M. H. Mamat ◽  
M. N. Amalina

<span>This paper presents the physical and optical properties of AZO thin films on Teflon substrate at low deposition temperature by spray pyrolysis. In this study, the effect of different process parameters such as spray time and substrate to nozzle distance on the physical and optical characteristic of aluminium doped zinc oxide (AZO) deposited on Teflon substrates was investigated. The AZO thin films were successfully deposited onto Teflon substrate by spray pyrolysis technique at low deposition temperature. The physical analysis by X-ray diffraction (XRD) shows that the deposited Teflon substrate films have a preferred orientation along the direction (100) and (101). Optical measurements were conducted using Jasco/V-670 Ex Uv-Vis-NIR Spectrophotometer model to confirms that in visible ray it is possible to get good reflectance of AZO films with a reflection of 80%. The values of band gaps Eg were calculated from the spectra of UV-Visible reflectance that were vary between 3.06 and 3.14 eV. </span>


Sign in / Sign up

Export Citation Format

Share Document