SIMULATION OF THE EFFECTS OF IONIZING RADIATION IN LOW INTENSITY VLSI
The effects of degradation parameters from the effects of low-intensity radiation. Methods of obtaining parameters.
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2004 ◽
Vol 34
(12)
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pp. 1147-1150
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2017 ◽
Vol 164
(2)
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pp. 214-217
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2018 ◽
Vol 21
(11)
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