Technology of materials for surface-ionization thermal emitter ions

2016 ◽  
Vol 1 (4) ◽  
pp. 3-3
Author(s):  
Vladimir Kapustin ◽  
A. Korgaviy
Keyword(s):  
Surface Ionization ◽  
Thermal Emitter

Low-workfunction field-emission source for high-resolution EELS

1987 ◽  
Vol 45 ◽  
pp. 132-133
Author(s):  
P. E. Batson
Keyword(s):  
High Resolution ◽  
Energy Loss ◽  
Electron Probe ◽  
Collection Efficiency ◽  
Electron Sources ◽  
Wien Filter ◽  
Half Angle ◽  
Thermal Emitter ◽  
Electron Energy Loss ◽  
Intrinsic Energy

In recent years,instrumentation for electron energy loss spectroscopy (EELS) has been steadily improved to increase energy resolution and collection efficiency. At present 0.40eV at 10mR collection half angle is available with commercial magnetic sectors (e.g. Gatan, Inc. and VG Microscopes, Ltd.), and 70meV at 10mR has been demonstrated by use of a Wien filter within a large deceleration field. When these high resolution spectrometers are coupled to the modern small electron probe instrument, we obtain a tool which promises to reveal local changes in bandstructure and bonding near defects and interfaces in heterogeneous materials.Unfortunately, typical electron sources have intrinsic energy widths which limit attainable spectroscopic resolution in the absence of some monochromation system. For instance, the W thermal emitter has a half width of about 1eV.

Surface ionization engine development

1966 ◽  
Author(s):  
M. ERNSTENE ◽  
A. FORRESTER
Keyword(s):  
Surface Ionization ◽  
Engine Development

Effect of Work Parameters for Surface Ionization Source on Ion Mobility Spectrum

2012 ◽  
Vol 39 (10) ◽  
pp. 1491-1495
Author(s):  
De-Xin ZHANG ◽  
Xiao-Guang GAO ◽  
Jian JIA ◽  
Xiu-Li HE ◽  
Jian-Ping LI
Keyword(s):  
Ion Mobility ◽  
Surface Ionization ◽  
Ionization Source ◽  
Mobility Spectrum

Determination of nitrogen compounds in gasoline by gas chromatography-surface ionization detector

2011 ◽  
Vol 29 (2) ◽  
pp. 141-145
Author(s):  
Weiwei LI ◽  
Kun DING ◽  
Hua WANG ◽  
Shiheng CHEN ◽  
Zheng SHEN ◽  
...  
Keyword(s):  
Gas Chromatography ◽  
Nitrogen Compounds ◽  
Surface Ionization ◽  
Ionization Detector

Surface Ionization of Methenamine on Intermetallic NaAu2

2020 ◽  
Vol 75 (14) ◽  
pp. 1838-1841
Author(s):  
M. V. Knatko ◽  
M. N. Lapushkin
Keyword(s):  
Surface Ionization

scholarly journals Hyperspectral Molecular Orientation Mapping in Metamaterials

2021 ◽  
Vol 11 (4) ◽  
pp. 1544
Author(s):  
Meguya Ryu ◽  
Yoshiaki Nishijima ◽  
Shinya Morimoto ◽  
Naoki To ◽  
Tomoki Hashizume ◽  
...  
Keyword(s):  
Molecular Orientation ◽  
Field Enhancement ◽  
Chemical Mapping ◽  
Metal Insulator ◽  
Orientation Mapping ◽  
Metal Insulator Metal ◽  
Finger Printing ◽  
Thermal Emitter ◽  
Ir Bands ◽  
Sub Wavelength

The four polarisation method is adopted for measurement of molecular orientation in dielectric nanolayers of metal-insulator-metal (MIM) metamaterials composed of gold nanodisks on polyimide and gold films. Hyperspectral mapping at the chemical finger printing spectral range of 4–20 μμm was carried out for MIM patterns of 1–2.5 μμm period (sub-wavelength). Overlay images taken at 0,π4,π2,3π4 orientation angles and subsequent baseline compensation are shown to be critically important for the interpretation of chemical mapping results and reduction of spurious artefacts. Light field enhancement in the 60-nm-thick polyimide (I in MIM) was responsible for strong absorption at the characteristic polyimide bands. Strong absorbance A at narrow IR bands can be used as a thermal emitter (emittance E=1−R), where R is the reflectance and A=1−R−T, where for optically thick samples the transmittance is T=0.

Measurement And Simulation Of X-Ray Emission From Multilayered Structures In Electron Probe Microanalysis.

1999 ◽  
Vol 5 (S2) ◽  
pp. 78-79
Author(s):  
C. Merlet ◽  
X. Llovet ◽  
F. Salvat
Keyword(s):  
Electron Probe ◽  
Numerical Models ◽  
Carbon Layer ◽  
Single Element ◽  
Surface Ionization ◽  
Copper Films ◽  
Multilayered Structures ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
Quantitative Epma

Studies of x-ray emission from thin films on substrates using an electron probe microanalyzer (EPMA) provide useful information on the characteristics of x-ray generation by electron beams. In this study, EPMA measurements of multilayered samples were performed in order to test and improve analytical and numerical models used for quantitative EPMA. These models provide relatively accurate results for samples consisting of layers with similar average atomic numbers, because of their similar properties regarding electron transport and x-ray generation. On the contrary, these models find difficulties to describe the process when the various layers have very different atomic numbers. In a previous work, we studied the surface ionization of thin copper films of various thicknesses deposited on substrates with very different atomic numbers. In the present communication, the study is extended to the case of multilayered specimens.The studied specimens consisted of thin copper films deposited on a carbon layer which, in turn, was placed on a variety of single-element substrates, ranging from Be to Bi.

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