Wave-Vector Filtering Effect for Electrons in Magnetically and Electrically Confined Semiconductor Heterostructure

2020 ◽  
Vol 10 (04) ◽  
pp. 123-132
Author(s):  
桂莲 张
2020 ◽  
Vol 34 (06) ◽  
pp. 2050080
Author(s):  
Meng-Rou Huang ◽  
Mao-Wang Lu ◽  
Xin-Hong Huang ◽  
Dong-Hui Liang ◽  
Zeng-Lin Cao

Wave vector filtering effect is explored for electrons in magnetically and electrically confined semiconductor heterostructure, which can be realized experimentally by depositing a ferromagnetic stripe and a Schottky metal stripe in parallel configuration on the surface of [Formula: see text] heterostructure. Adopting improved transfer matrix method to solve Schrödinger equation, electronic transmission coefficient is calculated exactly, and then wave vector filtering efficiency is obtained by differentiating transmission probability over longitudinal wave vector. An obvious wave vector filtering effect appears, due to an essentially two-dimensional process for electron transmission through a magnetic nanostructure. Besides, wave vector filtering efficiency is associated closely with width, position and externally applied voltage of Schottky metal stripe, which makes wave vector filtering effect become controllable and results in a manipulable momentum filter for nanoelectronics.


Vacuum ◽  
2018 ◽  
Vol 148 ◽  
pp. 173-177 ◽  
Author(s):  
Xu-Hui Liu ◽  
Chang-Shi Liu ◽  
Bing-Fa Xiao ◽  
Ye-Gang Lu
Keyword(s):  

1998 ◽  
Vol 83 (8) ◽  
pp. 4545-4547 ◽  
Author(s):  
Yong Guo ◽  
Bing-Lin Gu ◽  
Zhi-Qiang Li ◽  
Jing-Zhi Yu ◽  
Yoshiyuki Kawazoe

Author(s):  
H. S. Kim ◽  
S. S. Sheinin

The importance of image simulation in interpreting experimental lattice images is well established. Normally, in carrying out the required theoretical calculations, only zero order Laue zone reflections are taken into account. In this paper we assess the conditions for which this procedure is valid and indicate circumstances in which higher order Laue zone reflections may be important. Our work is based on an analysis of the requirements for obtaining structure images i.e. images directly related to the projected potential. In the considerations to follow, the Bloch wave formulation of the dynamical theory has been used.The intensity in a lattice image can be obtained from the total wave function at the image plane is given by: where ϕg(z) is the diffracted beam amplitide given by In these equations,the z direction is perpendicular to the entrance surface, g is a reciprocal lattice vector, the Cg(i) are Fourier coefficients in the expression for a Bloch wave, b(i), X(i) is the Bloch wave excitation coefficient, ϒ(i)=k(i)-K, k(i) is a Bloch wave vector, K is the electron wave vector after correction for the mean inner potential of the crystal, T(q) and D(q) are the transfer function and damping function respectively, q is a scattering vector and the summation is over i=l,N where N is the number of beams taken into account.


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